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Refinado por: Nome da Publicação: Ieee Transactions On Nuclear Science remover assunto: Laboratories remover
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Nonproportionality of Scintillator Detectors: Theory and Experiment
Nonproportionality of Scintillator Detectors: Theory and Experiment
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Nonproportionality of Scintillator Detectors: Theory and Experiment

Payne, S.A. ; Cherepy, N.J. ; Hull, G. ; Valentine, J.D. ; Moses, W.W. ; Woon-Seng Choong

IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.2506-2512 [Periódico revisado por pares]

New York: IEEE

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2
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
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The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

Warren, K.M. ; Weller, R.A. ; Mendenhall, M.H. ; Reed, R.A. ; Ball, D.R. ; Howe, C.L. ; Olson, B.D. ; Alles, M.L. ; Massengill, L.W. ; Schrimpf, R.D. ; Haddad, N.F. ; Doyle, S.E. ; McMorrow, D. ; Melinger, J.S. ; Lotshaw, W.T.

IEEE transactions on nuclear science, 2005-12, Vol.52 (6), p.2125-2131 [Periódico revisado por pares]

New York: IEEE

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3
Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection
Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection
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Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

Black, J.D. ; Ball, D.R. ; Robinson, W.H. ; Fleetwood, D.M. ; Schrimpf, R.D. ; Reed, R.A. ; Black, D.A. ; Warren, K.M. ; Tipton, A.D. ; Dodd, P.E. ; Haddad, N.F. ; Xapsos, M.A. ; Kim, H.S. ; Friendlich, M.

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.2943-2947 [Periódico revisado por pares]

New York: IEEE

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4
Timing Performances of Large Area Silicon Photomultipliers Fabricated at STMicroelectronics
Timing Performances of Large Area Silicon Photomultipliers Fabricated at STMicroelectronics
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Timing Performances of Large Area Silicon Photomultipliers Fabricated at STMicroelectronics

Mazzillo, Massimo ; Condorelli, Giovanni ; Sanfilippo, Delfo ; Valvo, Giuseppina ; Carbone, Beatrice ; Piana, Angelo ; Fallica, Giorgio ; Ronzhin, Anatoly ; Demarteau, Marcel ; Los, Sergey ; Ramberg, Erik

IEEE transactions on nuclear science, 2010-08, Vol.57 (4), p.2273-2279 [Periódico revisado por pares]

New York: IEEE

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5
A 62-MeV proton beam for the treatment of ocular melanoma at Laboratori Nazionali del Sud-INFN
A 62-MeV proton beam for the treatment of ocular melanoma at Laboratori Nazionali del Sud-INFN
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A 62-MeV proton beam for the treatment of ocular melanoma at Laboratori Nazionali del Sud-INFN

Cirrone, G.A.P. ; Cuttone, G. ; Lojacono, P.A. ; Lo Nigro, S. ; Mongelli, V. ; Patti, I.V. ; Privitera, G. ; Raffaele, L. ; Rifuggiato, D. ; Sabini, M.G. ; Salamone, V. ; Spatola, C. ; Valastro, L.M.

IEEE transactions on nuclear science, 2004-06, Vol.51 (3), p.860-865 [Periódico revisado por pares]

New York: IEEE

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6
Design and Implementation of a Mobile Radiological Emergency Unit Integrated in a Radiation Monitoring Network
Design and Implementation of a Mobile Radiological Emergency Unit Integrated in a Radiation Monitoring Network
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Design and Implementation of a Mobile Radiological Emergency Unit Integrated in a Radiation Monitoring Network

Baeza, A. ; Corbacho, J. A. ; Miranda, J.

IEEE transactions on nuclear science, 2013-04, Vol.60 (2), p.1400-1407 [Periódico revisado por pares]

IEEE

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7
MicroPET: a high resolution PET scanner for imaging small animals
MicroPET: a high resolution PET scanner for imaging small animals
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MicroPET: a high resolution PET scanner for imaging small animals

Cherry, S.R. ; Shao, Y. ; Silverman, R.W. ; Meadors, K. ; Siegel, S. ; Chatziioannou, A. ; Young, J.W. ; Jones, W. ; Moyers, J.C. ; Newport, D. ; Boutefnouchet, A. ; Farquhar, T.H. ; Andreaco, M. ; Paulus, M.J. ; Binkley, D.M. ; Nutt, R. ; Phelps, M.E.

IEEE transactions on nuclear science, 1997-06, Vol.44 (3), p.1161-1166 [Periódico revisado por pares]

IEEE

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8
Response of 5-nm Bulk FinFET SRAMs to Extreme Ionizing and Non-ionizing Doses
Response of 5-nm Bulk FinFET SRAMs to Extreme Ionizing and Non-ionizing Doses
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Response of 5-nm Bulk FinFET SRAMs to Extreme Ionizing and Non-ionizing Doses

Xiong, Yoni ; Pieper, Nicholas J. ; Dodds, Nathaniel A. ; Vizkelethy, Gyorgy ; Nowlin, R. Nathan ; Bhuva, Bharat L.

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.1-1 [Periódico revisado por pares]

New York: IEEE

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9
MaGe-a Geant4-Based Monte Carlo Application Framework for Low-Background Germanium Experiments
MaGe-a Geant4-Based Monte Carlo Application Framework for Low-Background Germanium Experiments
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MaGe-a Geant4-Based Monte Carlo Application Framework for Low-Background Germanium Experiments

Boswell, M ; Yuen-Dat Chan ; Detwiler, J A ; Finnerty, P ; Henning, R ; Gehman, V M ; Johnson, R A ; Jordan, D V ; Kazkaz, K ; Knapp, M ; Kroninger, K ; Lenz, D ; Leviner, L ; Jing Liu ; Xiang Liu ; MacMullin, S ; Marino, M G ; Mokhtarani, A ; Pandola, L ; Schubert, A G ; Schubert, J ; Tomei, C ; Volynets, O

IEEE transactions on nuclear science, 2011-06, Vol.58 (3), p.1212-1220 [Periódico revisado por pares]

New York: IEEE

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10
Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance
Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance
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Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance

Schwank, J. R. ; Shaneyfelt, M. R. ; Dodd, P. E.

IEEE transactions on nuclear science, 2013-06, Vol.60 (3), p.2074-2100 [Periódico revisado por pares]

United States: IEEE

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