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Refinado por: Nome da Publicação: Ieee Transactions On Nuclear Science remover assunto: Neutrons remover
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Extreme Atmospheric Radiation Environments and Single Event Effects
Extreme Atmospheric Radiation Environments and Single Event Effects
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Extreme Atmospheric Radiation Environments and Single Event Effects

Dyer, Clive ; Hands, Alex ; Ryden, Keith ; Lei, Fan

IEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.432-438 [Periódico revisado por pares]

New York: IEEE

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2
Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS
Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS
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Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS

Wang, Jialei ; Prinzie, Jeffrey ; Coronetti, Andrea ; Thys, S. ; Alia, Ruben Garcia ; Leroux, Paul

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.913-920 [Periódico revisado por pares]

New York: IEEE

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3
Single-Event Latch-Up: Increased Sensitivity From Planar to FinFET
Single-Event Latch-Up: Increased Sensitivity From Planar to FinFET
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Single-Event Latch-Up: Increased Sensitivity From Planar to FinFET

Karp, James ; Hart, Michael J. ; Maillard, Pierre ; Hellings, Geert ; Linten, Dimitri

IEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.217-222 [Periódico revisado por pares]

New York: IEEE

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4
Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node
Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node
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Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

Loveless, T D ; Jagannathan, S ; Reece, T ; Chetia, J ; Bhuva, B L ; McCurdy, M W ; Massengill, L W ; Wen, S-J ; Wong, R ; Rennie, D

IEEE transactions on nuclear science, 2011-06, Vol.58 (3), p.1008-1014 [Periódico revisado por pares]

New York: IEEE

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5
Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions
Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions
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Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions

Vlagkoulis, Vasileios ; Sari, Aitzan ; Vrachnis, John ; Antonopoulos, Georgios ; Segkos, Nikolaos ; Psarakis, Mihalis ; Tavoularis, Antonios ; Furano, Gianluca ; Boatella Polo, Cesar ; Poivey, Christian ; Ferlet-Cavrois, Veronique ; Kastriotou, Maria ; Fernandez Martinez, Pablo ; Alia, Ruben Garcia ; Voss, Kay-Obbe ; Schuy, Christoph

IEEE transactions on nuclear science, 2021-01, Vol.68 (1), p.36-45 [Periódico revisado por pares]

New York: IEEE

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6
Radiation Tolerance of Online Trigger System for COMET Phase-I
Radiation Tolerance of Online Trigger System for COMET Phase-I
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Radiation Tolerance of Online Trigger System for COMET Phase-I

Dekkers, Sam ; Nakazawa, Yu ; Fujii, Yuki ; Yoshida, Hisataka ; Wong, Ting Sam ; Ueno, Kazuki ; Nash, Jordan

IEEE transactions on nuclear science, 2021-08, Vol.68 (8), p.2020-2027 [Periódico revisado por pares]

IEEE

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7
Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs
Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs
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Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs

Jinhyun Noh ; Correas, Vincent ; Soonyoung Lee ; Jongsung Jeon ; Nofal, Issam ; Cerba, Jacques ; Belhaddad, Hafnaoui ; Alexandrescu, Dan ; YoungKeun Lee ; Kwon, Steve

IEEE transactions on nuclear science, 2015-08, Vol.62 (4), p.1642-1649 [Periódico revisado por pares]

IEEE

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8
The Effect of 1-10-MeV Neutrons on the JESD89 Test Standard
The Effect of 1-10-MeV Neutrons on the JESD89 Test Standard
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The Effect of 1-10-MeV Neutrons on the JESD89 Test Standard

Quinn, Heather ; Watkins, Adam ; Dominik, Laura ; Slayman, Charles

IEEE transactions on nuclear science, 2019-01, Vol.66 (1), p.140-147 [Periódico revisado por pares]

New York: IEEE

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9
Simulation of Single Particle Displacement Damage in Silicon - Part I: Global Approach and Primary Interaction Simulation
Simulation of Single Particle Displacement Damage in Silicon - Part I: Global Approach and Primary Interaction Simulation
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Simulation of Single Particle Displacement Damage in Silicon - Part I: Global Approach and Primary Interaction Simulation

Raine, Melanie ; Jay, Antoine ; Richard, Nicolas ; Goiffon, Vincent ; Girard, Sylvain ; Gaillardin, Marc ; Paillet, Philippe

IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.133-140 [Periódico revisado por pares]

New York: IEEE

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10
Lithium-Loaded Scintillators Coupled to a Custom-Designed Silicon Photomultiplier Array for Neutron and Gamma-Ray Detection
Lithium-Loaded Scintillators Coupled to a Custom-Designed Silicon Photomultiplier Array for Neutron and Gamma-Ray Detection
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Lithium-Loaded Scintillators Coupled to a Custom-Designed Silicon Photomultiplier Array for Neutron and Gamma-Ray Detection

Liang, Felix ; Brands, Hartmut ; Hoy, Les ; Preston, Jeff ; Smith, Jason

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.2162-2168 [Periódico revisado por pares]

New York: IEEE

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