Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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The Use of High Energy X-Ray Generators for TID Testing of Electronic DevicesGirones, Vincent ; Boch, Jerome ; Carapelle, Alain ; Chapon, Arnaud ; Maraine, Tadec ; Labau, Timothee ; Saigne, Frederic ; Alia, Ruben GarciaIEEE transactions on nuclear science, 2023-01, Vol.70 (8), p.1-1 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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Single-Event Latch-Up: Increased Sensitivity From Planar to FinFETKarp, James ; Hart, Michael J. ; Maillard, Pierre ; Hellings, Geert ; Linten, DimitriIEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.217-222 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Benefits of Complementary SEU Mitigation for the LEON3 Soft Processor on SRAM-Based FPGAsKeller, Andrew M. ; Wirthlin, Michael J.IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.519-528 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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The Effect of 1-10-MeV Neutrons on the JESD89 Test StandardQuinn, Heather ; Watkins, Adam ; Dominik, Laura ; Slayman, CharlesIEEE transactions on nuclear science, 2019-01, Vol.66 (1), p.140-147 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Single-Event Transient Case Study for System-Level Radiation Effects AnalysisCampola, Michael J. ; Austin, Rebekah A. ; Wilcox, Edward P. ; Kim, Hak S. ; Ladbury, Raymond L. ; Label, Kenneth A. ; Pellish, Jonathan A.IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.1002-1007 [Periódico revisado por pares]Goddard Space Flight Center: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and AnalysisBerg, M. ; Poivey, C. ; Petrick, D. ; Espinosa, D. ; Lesea, A. ; LaBel, K.A. ; Friendlich, M. ; Kim, H. ; Phan, A.IEEE transactions on nuclear science, 2008-08, Vol.55 (4), p.2259-2266 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Characterization of the First Prototypes of Silicon Photomultiplier Fabricated at ITC-irstPiemonte, C. ; Battiston, R. ; Boscardin, M. ; Betta, G.-F.D. ; Del Guerra, A. ; Dinu, N. ; Pozza, A. ; Zorzi, N.IEEE transactions on nuclear science, 2007-02, Vol.54 (1), p.236-244 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge CollectionBlack, J.D. ; Ball, D.R. ; Robinson, W.H. ; Fleetwood, D.M. ; Schrimpf, R.D. ; Reed, R.A. ; Black, D.A. ; Warren, K.M. ; Tipton, A.D. ; Dodd, P.E. ; Haddad, N.F. ; Xapsos, M.A. ; Kim, H.S. ; Friendlich, M.IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.2943-2947 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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The ECAT HRRT: performance and first clinical application of the new high resolution research tomographWienhard, K. ; Schmand, M. ; Casey, M.E. ; Baker, K. ; Bao, J. ; Eriksson, L. ; Jones, W.F. ; Knoess, C. ; Lenox, M. ; Lercher, M. ; Luk, P. ; Michel, C. ; Reed, J.H. ; Richerzhagen, N. ; Treffert, J. ; Vollmar, S. ; Young, J.W. ; Heiss, W.D. ; Nutt, R.IEEE transactions on nuclear science, 2002-02, Vol.49 (1), p.104-110 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge SharingAmusan, O.A. ; Massengill, L.W. ; Baze, M.P. ; Bhuva, B.L. ; Witulski, A.F. ; DasGupta, S. ; Sternberg, A.L. ; Fleming, P.R. ; Heath, C.C. ; Alles, M.L.IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2584-2589 [Periódico revisado por pares]New York: IEEETexto completo disponível |