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Automatic Adjustment of Confidence Values in Self-training Semi-supervised Method
Automatic Adjustment of Confidence Values in Self-training Semi-supervised Method
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Ata de Congresso 		Adicionar ao Meu Espaço

Automatic Adjustment of Confidence Values in Self-training Semi-supervised Method

Ovidio Vale, Karliane M. ; P. Canuto, Anne Magaly de ; Santos, Araken de Medeiros ; Gorgonio, Flavius da Luz e ; M. Tavares, Alan de ; Gorgnio, Arthur C. ; Alves, Cainan T.

2018 International Joint Conference on Neural Networks (IJCNN), 2018, p.1-8

IEEE

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2
Model Reference Adaptive Control with inverse compensation applied to a pH plant
Model Reference Adaptive Control with inverse compensation applied to a pH plant
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Ata de Congresso 		Adicionar ao Meu Espaço

Model Reference Adaptive Control with inverse compensation applied to a pH plant

Vale, M R B G ; Fonseca, D G V ; Pereira, K R C ; Maitelli, A L ; Araujo, F M U ; Casillo, D S S

2010 IEEE International Symposium on Industrial Electronics, 2010, p.244-249

IEEE

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3
Implantable Wireless Microsystem for Physiological Functions Control
Implantable Wireless Microsystem for Physiological Functions Control
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Implantable Wireless Microsystem for Physiological Functions Control

Vale, Paulo ; Rua, T. ; Mendes, P.M.

2007 IEEE International Symposium on Industrial Electronics, 2007, p.1491-1495

IEEE

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4
Electrical power network decomposition for parallel computations
Electrical power network decomposition for parallel computations
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Electrical power network decomposition for parallel computations

Vale, M.H.M. ; Falcao, D.M. ; Kaszkurewicz, E.

1992 IEEE International Symposium on Circuits and Systems (ISCAS), 1992, Vol.6, p.2761-2764 vol.6

IEEE

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5
Short-term scheduling considering five-minute and hour-ahead energy resource management
Short-term scheduling considering five-minute and hour-ahead energy resource management
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Short-term scheduling considering five-minute and hour-ahead energy resource management

Silva, M. ; Morais, H. ; Vale, Z. ; Faria, P.

2012 IEEE Power and Energy Society General Meeting, 2012, p.1-8

IEEE

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6
Use of additive manufacturing for polymer tooling: Case study from reaction injection molding
Use of additive manufacturing for polymer tooling: Case study from reaction injection molding
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Use of additive manufacturing for polymer tooling: Case study from reaction injection molding

Storsanden, Audun L. ; Vale, Marcus ; Ratnayake, R. M. Chandima

2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2017, p.1607-1610

IEEE

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7
Typical load profiles in the smart grid context - A clustering methods comparison
Typical load profiles in the smart grid context - A clustering methods comparison
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Typical load profiles in the smart grid context - A clustering methods comparison

Ramos, S. ; Duarte, J. M. M. ; Soares, J. ; Vale, Z. ; Duarte, F. J.

2012 IEEE Power and Energy Society General Meeting, 2012, p.1-8

IEEE

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8
Intelligent decision making in electricity markets: Simulated annealing Q-Learning
Intelligent decision making in electricity markets: Simulated annealing Q-Learning
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Intelligent decision making in electricity markets: Simulated annealing Q-Learning

Pinto, T. ; Sousa, T. M. ; Vale, Z. ; Morais, H. ; Praca, I.

2012 IEEE Power and Energy Society General Meeting, 2012, p.1-8

IEEE

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9
A Variability-Aware Design Approach to the Data Analysis Modeling Process
A Variability-Aware Design Approach to the Data Analysis Modeling Process
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A Variability-Aware Design Approach to the Data Analysis Modeling Process

Vale Tavares, Maria Cristina ; Alencar, Paulo ; Cowan, Donald

2018 IEEE International Conference on Big Data (Big Data), 2018, p.2818-2827

IEEE

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10
Shifting SOA to MPSoC: An exploratory example of application
Shifting SOA to MPSoC: An exploratory example of application
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Shifting SOA to MPSoC: An exploratory example of application

Salgado, F. ; Garcia, P. ; Gomes, T. ; Vale, J. ; Pinto, S. ; Cabral, J. ; Ekpanyapong, M.

Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation (ETFA 2012), 2012, p.1-4

IEEE

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