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1
Breakthrough curvilinear ILT enabled by multi-beam mask writing
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Breakthrough curvilinear ILT enabled by multi-beam mask writing

Pang, Linyong (Leo) ; Russell, Ezequiel Vidal ; Baggenstoss, Bill ; Lee, Michael ; Digaum, Jennefir ; Yang, Ming-Chuan ; Ungar, P. Jeffrey ; Bouaricha, Ali ; Wang, Kechang ; Su, Bo ; Pearman, Ryan ; Fujimura, Aki

Journal of micro/nanolithography, MEMS, and MOEMS, 2021-10, Vol.20 (4), p.041405-041405 [Periódico revisado por pares]

Society of Photo-Optical Instrumentation Engineers

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Point defect structures and energetics in Si using an empirical potential
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Point defect structures and energetics in Si using an empirical potential

Ungar, P. J. ; Takai, T. ; Halicioglu, T. ; Tiller, W. A.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1993-01, Vol.11 (1), p.224-230 [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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3
Free energies, structures, and diffusion of point defects in Si using an empirical potential
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Free energies, structures, and diffusion of point defects in Si using an empirical potential

Ungar, PJ ; Halicioglu, T ; Tiller, WA

Physical review. B, Condensed matter, 1994-09, Vol.50 (11), p.7344-7357

United States

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4
New beamline dedicated to solution scattering from biological macromolecules at the ESRF
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New beamline dedicated to solution scattering from biological macromolecules at the ESRF

Pernot, P ; Theveneau, P ; Giraud, T ; Fernandes, R Nogueira ; Nurizzo, D ; Spruce, D ; Surr, J ; McSweeney, S ; Round, A ; Felisaz, F ; Foedinger, L ; Gobbo, A ; Huet, J ; Villard, C ; Cipriani, F

Journal of physics. Conference series, 2010-10, Vol.247 (1), p.012009 [Periódico revisado por pares]

Bristol: IOP Publishing

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5
Quantification of dislocations densities in zirconium hydride by X-ray line profile analysis
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Quantification of dislocations densities in zirconium hydride by X-ray line profile analysis

Vicente Alvarez, M.A. ; Santisteban, J.R. ; Vizcaíno, P. ; Ribárik, G. ; Ungar, T.

Acta materialia, 2016-09, Vol.117, p.1-12 [Periódico revisado por pares]

United States: Elsevier Ltd

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6
Traceable size determination of PMMA nanoparticles based on Small Angle X-ray Scattering (SAXS)
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Traceable size determination of PMMA nanoparticles based on Small Angle X-ray Scattering (SAXS)

Gleber, G ; Cibik, L ; Haas, S ; Hoell, A ; Müller, P ; Krumrey, M

Journal of physics. Conference series, 2010-10, Vol.247 (1), p.012027 [Periódico revisado por pares]

Bristol: IOP Publishing

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7
Ultrafast spin dynamics in II-VI diluted magnetic semiconductors with spin-orbit interaction
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Ultrafast spin dynamics in II-VI diluted magnetic semiconductors with spin-orbit interaction

Ungar, F. ; Cygorek, M. ; Tamborenea, P. I. ; Axt, V. M.

Physical review. B, Condensed matter and materials physics, 2015-05, Vol.91 (19), Article 195201 [Periódico revisado por pares]

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8
Microstructure, Texture, and Strength Development during High-Pressure Torsion of CrMnFeCoNi High-Entropy Alloy
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Microstructure, Texture, and Strength Development during High-Pressure Torsion of CrMnFeCoNi High-Entropy Alloy

Skrotzki, Werner ; Pukenas, Aurimas ; Odor, Eva ; Joni, Bertalan ; Ungar, Tamas ; Völker, Bernhard ; Hohenwarter, Anton ; Pippan, Reinhard ; George, Easo P.

Crystals (Basel), 2020-04, Vol.10 (4), p.336 [Periódico revisado por pares]

Basel: MDPI AG

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9
Microstructure and texture evolution during severe plastic deformation of CrMnFeCoNi high-entropy alloy
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Microstructure and texture evolution during severe plastic deformation of CrMnFeCoNi high-entropy alloy

Skrotzki, W ; Pukenas, A ; Joni, B ; Odor, E ; Ungar, T ; Hohenwarter, A ; Pippan, R ; George, E P

IOP conference series. Materials Science and Engineering, 2017-05, Vol.194 (1), p.12028 [Periódico revisado por pares]

Bristol: IOP Publishing

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10
Microstructure evolution during cold rolling in a nanocrystalline Ni–Fe alloy determined by synchrotron X-ray diffraction
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Microstructure evolution during cold rolling in a nanocrystalline Ni–Fe alloy determined by synchrotron X-ray diffraction

Li, L. ; Ungár, T. ; Wang, Y.D. ; Morris, J.R. ; Tichy, G. ; Lendvai, J. ; Yang, Y.L. ; Ren, Y. ; Choo, H. ; Liaw, P.K.

Acta materialia, 2009-10, Vol.57 (17), p.4988-5000 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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