Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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An elementary quantum network of single atoms in optical cavitiesRITTER, Stephan ; NÖLLEKE, Christian ; HAHN, Carolin ; REISERER, Andreas ; NEUZNER, Andreas ; UPHOFF, Manuel ; MÜCKE, Martin ; FIGUEROA, Eden ; BOCHMANN, Joerg ; REMPE, GerhardNature (London), 2012-04, Vol.484 (7393), p.195-200 [Periódico revisado por pares]London: Nature Publishing GroupTexto completo disponível |
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2 |
Material Type: Artigo
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Real-time quantum feedback prepares and stabilizes photon number statesSAYRIN, Clement ; DOTSENKO, Igor ; RAIMOND, Jean-Michel ; HAROCHE, Serge ; XINGXING ZHOU ; PEAUDECERF, Bruno ; RYBARCZYK, Theo ; GLEYZES, Sebastien ; ROUCHON, Pierre ; MIRRAHIMI, Mazyar ; AMINI, Hadis ; BRUNE, MichelNature (London), 2011-09, Vol.477 (7362), p.73-77 [Periódico revisado por pares]London: Nature Publishing GroupTexto completo disponível |
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3 |
Material Type: Artigo
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Evidence for Efimov quantum states in an ultracold gas of caesium atomsNägerl, H.-C ; Kraemer, T ; Mark, M ; Waldburger, P ; Danzl, J. G ; Chin, C ; Engeser, B ; Lange, A. D ; Pilch, K ; Jaakkola, A ; Grimm, RNature, 2006-03, Vol.440 (7082), p.315-318 [Periódico revisado por pares]London: Nature PublishingTexto completo disponível |
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4 |
Material Type: Artigo
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Quantum signatures of chaos in a kicked topSmith, A ; Chaudhury, S ; Jessen, P. S ; Ghose, S ; Anderson, B. ENature (London), 2009-10, Vol.461 (7265), p.768-771 [Periódico revisado por pares]London: Nature Publishing GroupTexto completo disponível |
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5 |
Material Type: Artigo
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Simultaneous Tensor Decomposition and Completion Using Factor PriorsYi-Lei Chen ; Chiou-Ting Hsu ; Liao, Hong-Yuan MarkIEEE transactions on pattern analysis and machine intelligence, 2014-03, Vol.36 (3), p.577-591 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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A 1.2-V 8.3-nJ CMOS Humidity Sensor for RFID ApplicationsZhichao Tan ; Daamen, Roel ; Humbert, Aurelie ; Ponomarev, Youri V. ; Youngcheol Chae ; Pertijs, Michiel A. P.IEEE journal of solid-state circuits, 2013-10, Vol.48 (10), p.2469-2477 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Ice-Shelf Melting Around AntarcticaRignot, E. ; Jacobs, S. ; Mouginot, J. ; Scheuchl, B.Science (American Association for the Advancement of Science), 2013-07, Vol.341 (6143), p.266-270 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
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8 |
Material Type: Artigo
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A Least-Squares Framework for Component AnalysisDe la Torre, F.IEEE transactions on pattern analysis and machine intelligence, 2012-06, Vol.34 (6), p.1041-1055 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Direct Kinetic Measurements of Criegee Intermediate (CH2OO) Formed by Reaction of CH2I with O2WELZ, Oliver ; SAVEE, John D ; OSBORN, David L ; VASU, Subith S ; PERCIVAL, Carl J ; SHALLCROSS, Dudley E ; TAATIES, Craig AScience (American Association for the Advancement of Science), 2012-01, Vol.335 (6065), p.204-207 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
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10 |
Material Type: Artigo
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High-Throughput Droplet Digital PCR System for Absolute Quantitation of DNA Copy NumberHindson, Benjamin J ; Ness, Kevin D ; Masquelier, Donald A ; Belgrader, Phillip ; Heredia, Nicholas J ; Makarewicz, Anthony J ; Bright, Isaac J ; Lucero, Michael Y ; Hiddessen, Amy L ; Legler, Tina C ; Kitano, Tyler K ; Hodel, Michael R ; Petersen, Jonathan F ; Wyatt, Paul W ; Steenblock, Erin R ; Shah, Pallavi H ; Bousse, Luc J ; Troup, Camille B ; Mellen, Jeffrey C ; Wittmann, Dean K ; Erndt, Nicholas G ; Cauley, Thomas H ; Koehler, Ryan T ; So, Austin P ; Dube, Simant ; Rose, Klint A ; Montesclaros, Luz ; Wang, Shenglong ; Stumbo, David P ; Hodges, Shawn P ; Romine, Steven ; Milanovich, Fred P ; White, Helen E ; Regan, John F ; Karlin-Neumann, George A ; Hindson, Christopher M ; Saxonov, Serge ; Colston, Bill WAnalytical chemistry (Washington), 2011-11, Vol.83 (22), p.8604-8610 [Periódico revisado por pares]Washington, DC: American Chemical SocietyTexto completo disponível |