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Material Type: Resenha
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Rietveld analysis of CaCu^sub 3^Ti^sub 4^O^sub 12^ thin films obtained by RF-sputteringFoschini, C R ; Tararam, R ; Simões, A Z ; Rocha, L S ; Santos, C O; P ; Longo, E ; Varela, J AJournal of Materials Science. Materials in Electronics, 2016, Vol.27 (3), p.2175 [Periódico revisado por pares]New York: Springer Nature B.VTexto completo disponível |