Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Outros
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Characterizing the Structure of Lithium Metal Batteries using Local Ultrasonic Resonance Spectroscopy (LURS)Webster, Matt ; Perey, Daniel ; Lin, Yi ; Frankforter, ErikLangley Research Center 2024Texto completo disponível |
2 |
Material Type: Outros
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Remedial EEE Parts 101 Part Number Decipher (AKA Know What You’re Getting)Faller, CarltonJohnson Space Center: National Aeronautics and Space Administration 2023Texto completo disponível |
3 |
Material Type: Outros
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An Examination of Heavy Ion-Induced Persistent Visual Error Signatures in an Electronic Display Driver Integrated CircuitRyder, Landen D ; Wyrwas, Edward J ; Cisneros, Geraldo A ; Garrett, Tyler M ; Roffe, Seth S ; Bautista, Justin R ; Xu, Xiaojing ; Campola, Michael J ; Gaza, RazvanGoddard Space Flight Center 2023Texto completo disponível |
4 |
Material Type: Outros
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Translating and Supplementing Si Based Radiation Effects Knowledge to the Wide Band-Gap Devices of Tomorrow’s Space Flight MissionsOsheroff, JasonGoddard Space Flight Center: National Aeronautics and Space Administration 2023Texto completo disponível |
5 |
Material Type: Outros
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FY23 Ultra Fast Proximity Charger (UFPC) TP Annual Review PresentationEckard, James ; Schapiro, JoshuaGlenn Research Center 2023Texto completo disponível |
6 |
Material Type: Outros
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Pt/HTCC Alumina Based Electronic Packaging System and Integration Processes for High Temperature Harsh Environment ApplicationsChen, Liangyu ; Neudeck, Philip G ; Spry, David J ; Hunter, Gary WGlenn Research Center 2023Texto completo disponível |
7 |
Material Type: Outros
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JC-13 Fluorocarbon Tech DiscussionPutman, Carol ; Damron, BennyMarshall Space Flight Center 2023Texto completo disponível |
8 |
Material Type: Outros
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Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash MemoriesWilcox, Edward P. ; Joplin, Matthew B. ; Berg, Melanie D.Goddard Space Flight Center: NASA Electronic Parts and Packaging (NEPP) Program 2023Texto completo disponível |
9 |
Material Type: Outros
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Update on NEPP SEE FPGA Test and Analysis Featuring: The Lattice Avant TSMC 16 nm FinFet, The Xilinx TSMC 7nm Versal AIE Core, and Fluence to Failure Applied MethodologiesBerg, MelanieGoddard Space Flight Center: NASA Electronic Parts and Packaging (NEPP) Program 2023Texto completo disponível |
10 |
Material Type: Outros
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NASA EEEE Parts Management – Overview & StatusDouglas, SusanaGoddard Space Flight Center: NASA Electronic Parts and Packaging (NEPP) Program 2023Texto completo disponível |