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Material Type: Artigo
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Influence of Beam Conditions and Energy for SEE TestingFerlet-Cavrois, Veronique ; Schwank, James R. ; Liu, Sandra ; Muschitiello, Michele ; Beutier, Thierry ; Javanainen, Arto ; Hedlund, Alex ; Poivey, Christian ; Mohammadzadeh, Ali ; Harboe-Sorensen, Reno ; Santin, Giovanni ; Nickson, Bob ; Menicucci, Alessandra ; Binois, Christian ; Peyre, Daniel ; Hoeffgen, Stefan Klaus ; Metzger, Stefan ; Schardt, Dieter ; Kettunen, Heikki ; Virtanen, Ari ; Berger, Guy ; Piquet, Bruno ; Foy, Jean-Claude ; Zafrani, Max ; Truscott, Pete ; Poizat, Marc ; Bezerra, FrancoiseIEEE transactions on nuclear science, 2012-08, Vol.59 (4), p.1149-1160 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Silicon carbide radiation detector for harsh environmentsMetzger, S. ; Henschel, H. ; Kohn, O. ; Lennartz, W.IEEE transactions on nuclear science, 2002-06, Vol.49 (3), p.1351-1355 [Periódico revisado por pares]New York: IEEETexto completo disponível |