skip to main content
Language:
Refined by: Journal Title: 11th International Conference On Synchrotron Radiation Instrumentation remove subject: Physics, Applied remove Journal Of Physics: Conference Series remove
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Application of focused-beam flat-sample method to synchrotron powder X-ray diffraction with anomalous scattering effect
Application of focused-beam flat-sample method to synchrotron powder X-ray diffraction with anomalous scattering effect
Material Type:
Article 		Add to e-Shelf

Application of focused-beam flat-sample method to synchrotron powder X-ray diffraction with anomalous scattering effect

Tanaka, M ; Katsuya, Y ; Matsushita, Y

Journal of physics. Conference series, 2013-01, Vol.425 (13), p.132018-4 [Peer Reviewed Journal]

Bristol: IOP Publishing

Full text available

Citations Cited by
2
A fast X-ray detector using silicon avalanche photodiodes of 64-pixel linear array
A fast X-ray detector using silicon avalanche photodiodes of 64-pixel linear array
Material Type:
Article 		Add to e-Shelf

A fast X-ray detector using silicon avalanche photodiodes of 64-pixel linear array

Kishimoto, S ; Yonemura, H ; Adachi, S ; Shimazaki, S ; Ikeno, M ; Saito, M ; Taniguchi, T ; Tanaka, M

Journal of physics. Conference series, 2013-03, Vol.425 (6), p.62007-4 [Peer Reviewed Journal]

Bristol: IOP Publishing

Full text available

Citations Cited by
3
Commissioning results of the U14 cryogenic undulator at SLS
Commissioning results of the U14 cryogenic undulator at SLS
Material Type:
Article 		Add to e-Shelf

Commissioning results of the U14 cryogenic undulator at SLS

Calvi, M ; Schmidt, Th ; Anghel, A ; Cervellino, A ; Leake, S J ; Willmott, P R ; Tanaka, T

Journal of physics. Conference series, 2013-03, Vol.425 (3), p.32017-4 [Peer Reviewed Journal]

Bristol: IOP Publishing

Full text available

Citations Cited by
4
Development of ionization chamber for in-line intensity monitoring of large profile parametric X-ray beam
Development of ionization chamber for in-line intensity monitoring of large profile parametric X-ray beam
Material Type:
Article 		Add to e-Shelf

Development of ionization chamber for in-line intensity monitoring of large profile parametric X-ray beam

Tanaka, T ; Kuwada, T ; Takahashi, Y ; Hayakawa, K ; Hayakawa, Y ; Sakai, T ; Nogami, K ; Nakao, K ; Inagaki, M ; Sato, I

Journal of physics. Conference series, 2013-03, Vol.425 (17), p.172001-4 [Peer Reviewed Journal]

Bristol: IOP Publishing

Full text available

Citations Cited by
5
Micro-focusing of hard x-ray free electron laser radiation using Kirkpatrick-Baez mirror system
Micro-focusing of hard x-ray free electron laser radiation using Kirkpatrick-Baez mirror system
Material Type:
Article 		Add to e-Shelf

Micro-focusing of hard x-ray free electron laser radiation using Kirkpatrick-Baez mirror system

Yumoto, H ; Mimura, H ; Matsuyama, S ; Koyama, T ; Hachisu, Y ; Kimura, T ; Yokoyama, H ; Kim, J ; Sano, Y ; Tono, K ; Togashi, T ; Inubushi, Y ; Sato, T ; Tanaka, T ; Yabashi, M ; Ohashi, H ; Ohmori, H ; Ishikawa, T ; Yamauchi, K

Journal of physics. Conference series, 2013-03, Vol.425 (5), p.52022-4 [Peer Reviewed Journal]

Bristol: IOP Publishing

Full text available

Citations Cited by

  • Implemented by: ABCD-USP USP   Social Network Logos: Freepik

Searching Remote Databases, Please Wait

  • Searching for
  • inscope:(USP_VIDEOS),scope:("PRIMO"),scope:(USP_FISICO),scope:(USP_EREVISTAS),scope:(USP),scope:(USP_EBOOKS),scope:(USP_PRODUCAO),primo_central_multiple_fe
  • Show me what you have so far