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Refinado por: Nome da Publicação: Applied Physics Letters remover
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1
Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction
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Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction

Scheler, T ; Rodrigues, M ; Cornelius, T W ; Mocuta, C ; Malachias, A ; Magalhães-Paniago, R ; Comin, F ; Chevrier, J ; Metzger, T H

Applied physics letters, 2009-01, Vol.94 (2), p.023109-023109-3 [Periódico revisado por pares]

American Institute of Physics

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2
Strain states in a quantum well embedded into a rolled-up microtube:X-ray and photoluminescence studies
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Strain states in a quantum well embedded into a rolled-up microtube:X-ray and photoluminescence studies

Deneke, Ch ; Malachias, A ; Kiravittaya, S ; Benyoucef, M ; Metzger, T H ; Schmidt, O G

Applied physics letters, 2010-04, Vol.96 (14), p.143101-143101-3 [Periódico revisado por pares]

American Institute of Physics

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3
Composition and strain in SiGe/Si(001) "nanorings" revealed by combined x-ray and selective wet chemical etching methods
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Composition and strain in SiGe/Si(001) "nanorings" revealed by combined x-ray and selective wet chemical etching methods

Stoffel, M ; Malachias, A ; Rastelli, A ; Metzger, T H ; Schmidt, O G

Applied physics letters, 2009-06, Vol.94 (25), p.253114-253114-3 [Periódico revisado por pares]

American Institute of Physics

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4
Understanding molecular interactions in light-emitting polymer bilayers: The role of solvents and molecular structure on the interface quality
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Understanding molecular interactions in light-emitting polymer bilayers: The role of solvents and molecular structure on the interface quality

de Pauli, M. ; Santos, P. L. ; Costa, B. B. A. ; Magalhães-Paniago, R. ; Cury, L. A. ; Malachias, A.

Applied physics letters, 2014-04, Vol.104 (16) [Periódico revisado por pares]

Melville: American Institute of Physics

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5
Ordered domain lateral location, symmetry, and thermal stability in Ge:Si islands
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Ordered domain lateral location, symmetry, and thermal stability in Ge:Si islands

Richard, M.-I. ; Malachias, A. ; Schülli, T. U. ; Favre-Nicolin, V. ; Zhong, Z. ; Metzger, T. H. ; Renaud, G.

Applied physics letters, 2015-01, Vol.106 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

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6
Direct evidence of strain transfer for InAs island growth on compliant Si substrates
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Direct evidence of strain transfer for InAs island growth on compliant Si substrates

Marçal, L. A. B. ; Richard, M.-I. ; Magalhães-Paniago, R. ; Cavallo, F. ; Lagally, M. G. ; Schmidt, O. G. ; Schülli, T. Ü. ; Deneke, Ch ; Malachias, Angelo

Applied physics letters, 2015-04, Vol.106 (15) [Periódico revisado por pares]

United States

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7
Resonant x-ray scattering from self-assembled InP∕GaAs(001) islands: Understanding the chemical structure of quaternary quantum dots
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Resonant x-ray scattering from self-assembled InP∕GaAs(001) islands: Understanding the chemical structure of quaternary quantum dots

Coelho, L. N. ; Magalhães-Paniago, R. ; Malachias, A. ; Zelcovit, J. G. ; Cotta, M. A.

Applied physics letters, 2008-01, Vol.92 (2) [Periódico revisado por pares]

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8
Direct observation of the coexistence of coherent and incoherent InAs self-assembled dots by x-ray scattering
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Direct observation of the coexistence of coherent and incoherent InAs self-assembled dots by x-ray scattering

Malachias, A. ; Magalhães-Paniago, R. ; Neves, B. R. A. ; Rodrigues, W. N. ; Moreira, M. V. B. ; Pfannes, H.-D. ; de Oliveira, A. G. ; Kycia, S. ; Metzger, T. H.

Applied physics letters, 2001-12, Vol.79 (26), p.4342-4344 [Periódico revisado por pares]

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9
X-ray determination of vertical ordering of InAs quantum dots in InAs/GaAs multilayers
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X-ray determination of vertical ordering of InAs quantum dots in InAs/GaAs multilayers

González, J. C. ; Magalhães-Paniago, R. ; Rodrigues, W. N. ; Malachias, A. ; Moreira, M. V. B. ; de Oliveira, A. G. ; Mazzaro, I. ; Cusatis, C. ; Metzger, T. H. ; Peisl, J.

Applied physics letters, 2001-02, Vol.78 (8), p.1056-1058 [Periódico revisado por pares]

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