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1
Quantitative measurement of manganese incorporation into (In,Mn)As islands by resonant x-ray scattering
Quantitative measurement of manganese incorporation into (In,Mn)As islands by resonant x-ray scattering
Material Type:
Artigo 		Adicionar ao Meu Espaço

Quantitative measurement of manganese incorporation into (In,Mn)As islands by resonant x-ray scattering

L. A. B. Marçal M. S. C Mazzoni; L. N Coelho; Euclydes Marega Júnior; G. J Salamo; R Magalhães-Paniago; A Malachias

Physical Review B College Park : American Physical Society - APS v. 96, n. 24, p. 245301-1-245301-7, Dec. 2017

College Park 2017

Localização: IFSC - Inst. Física de São Carlos    (PROD027144 )(Acessar)

2
In-plane mapping of buried 'In''Ga''As' quantum rings and hybridization effects on the electronic structure
In-plane mapping of buried 'In''Ga''As' quantum rings and hybridization effects on the electronic structure
Material Type:
Artigo 		Adicionar ao Meu Espaço

In-plane mapping of buried 'In''Ga''As' quantum rings and hybridization effects on the electronic structure

M. D. Teodoro A Malachias; V. Lopes Oliveira; D. F Cesar; V. Lopez Richard; G. E Marques; Euclydes Marega Júnior; M Benamara; Yu. I Mazur; G. J Salamo

Journal of Applied Physics College Park : American Institute of Physics - AIP v. 112, n. 1, p. 014319-1-014319-9, Jul. 2012

College Park 2012

Localização: IFSC - Inst. Física de São Carlos    (PROD019676 )(Acessar)

3
In-plane mapping of buried InGaAs quantum rings and hybridization effects on the electronic structure
In-plane mapping of buried InGaAs quantum rings and hybridization effects on the electronic structure
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

In-plane mapping of buried InGaAs quantum rings and hybridization effects on the electronic structure

M. Daldin Teodoro A Malachias; V. Lopes Oliveira; D. Ferreira Cesar; V Lopez-Richard; G. Eugenio Marques; Euclydes Marega Júnior; M Benamara; Y Mazur; G. J Salamo; International Conference on Superlattices, Nanostructures and Nanodevices - ICSNN (2012 Dresden)

Abstracts Dresden, 2012

Dresden s.n. 2012

Localização: IFSC - Inst. Física de São Carlos    (PROD020823 )(Acessar)

4
Anisotropic confinement, electronic coupling and strain induced effects detected by valence-band anisotropy in self-assembled quantum dots
Anisotropic confinement, electronic coupling and strain induced effects detected by valence-band anisotropy in self-assembled quantum dots
Material Type:
Artigo 		Adicionar ao Meu Espaço

Anisotropic confinement, electronic coupling and strain induced effects detected by valence-band anisotropy in self-assembled quantum dots

L. Villegas-Lelovsky M. D Teodoro; V. Lopez Richard; C Calseverino; A Malachias; Euclydes Marega Júnior; B. L Liang; Yu I Mazur; G. E Marques; C Trallero-Giner; G. J Salamo

Nanoscale Research Letters New York : Springer v. 6, n. 1, p. 56-1-56-12, 2011

New York 2011

Localização: IFSC - Inst. Física de São Carlos    (PROD017981 )(Acessar)

5
Anisotropic confinement, electronic coupling and strain induced effects detected by valence-band anisotropy in self-assembled quantum dots
Anisotropic confinement, electronic coupling and strain induced effects detected by valence-band anisotropy in self-assembled quantum dots
Material Type:
Artigo 		Adicionar ao Meu Espaço

Anisotropic confinement, electronic coupling and strain induced effects detected by valence-band anisotropy in self-assembled quantum dots

L. Villegas-Lelovsky M. D Teodoro; V. Lopez Richard; C Calseverino; A Malachias; Euclydes Marega Júnior; B. L Liang; Yu I Mazur; G. E Marques; C Trallero-Giner; G. J Salamo

Nanoscale Research Letters New York : Springer v. 6, n. 1, p. 56-1-56-12, 2011

New York 2011

Localização: IFSC - Inst. Física de São Carlos    (PROD017981 )(Acessar)

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Deste Autor:

  1. Salamo, G
  2. Marega Júnior, E
  3. Malachias, A
  4. Marques, G
  5. Teodoro, M

Neste Assunto:

  1. Poços Quânticos
  2. Fotoluminescência
  3. Materiais Nanoestruturados
  4. Estrutura Eletrônica
  5. Nanotecnologia

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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