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The Impact of the Electrode Performance on the Endurance Properties of the Phase Change Memory Device
The Impact of the Electrode Performance on the Endurance Properties of the Phase Change Memory Device
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The Impact of the Electrode Performance on the Endurance Properties of the Phase Change Memory Device

Lu, Y. Y. ; Cai, D. L. ; Chen, Y. F. ; Zheng, Y. H. ; Yan, S. ; Wu, L. ; Liu, Y. G. ; Li, Y. ; Song, Z. T.

IEEE transactions on device and materials reliability, 2019-03, Vol.19 (1), p.164-168 [Periódico revisado por pares]

New York: IEEE

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Water-Saving Strategies for the CPI
Water-Saving Strategies for the CPI
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Water-Saving Strategies for the CPI

Liu, Y A

Chemical Engineering, 2012-05, Vol.119 (5), p.34-41

New York: Access Intelligence LLC

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Electromigration Effect on Kinetics of Cu-Sn Intermetallic Compound Growth in Lead-Free Solder Joint
Electromigration Effect on Kinetics of Cu-Sn Intermetallic Compound Growth in Lead-Free Solder Joint
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Electromigration Effect on Kinetics of Cu-Sn Intermetallic Compound Growth in Lead-Free Solder Joint

Fu, Z. W. ; Zhou, B. ; Yao, R. H. ; Liu, Y. R. ; Li, X. P.

IEEE transactions on device and materials reliability, 2017-12, Vol.17 (4), p.773-779 [Periódico revisado por pares]

New York: IEEE

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4
Three-Dimensional Elastodynamic Simulations of Seismic and Aseismic Slip History of a Planar Strike-Slip Fault
Three-Dimensional Elastodynamic Simulations of Seismic and Aseismic Slip History of a Planar Strike-Slip Fault
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Three-Dimensional Elastodynamic Simulations of Seismic and Aseismic Slip History of a Planar Strike-Slip Fault

Lapusta, N ; Liu, Y

Eos (Washington, D.C.), 2006-12, Vol.87 (52)

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5
Bias-Stress-Induced Instability of Polymer Thin-Film Transistor Based on Poly(3-Hexylthiophene)
Bias-Stress-Induced Instability of Polymer Thin-Film Transistor Based on Poly(3-Hexylthiophene)
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Bias-Stress-Induced Instability of Polymer Thin-Film Transistor Based on Poly(3-Hexylthiophene)

Liu, Y. R. ; Liao, R. ; Lai, P. T. ; Yao, R. H.

IEEE transactions on device and materials reliability, 2012-03, Vol.12 (1), p.58-62 [Periódico revisado por pares]

New York: IEEE

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6
Low-Operating-Voltage Polymer Thin-Film Transistors Based on Poly(3-Hexylthiophene) With Hafnium Oxide as the Gate Dielectric
Low-Operating-Voltage Polymer Thin-Film Transistors Based on Poly(3-Hexylthiophene) With Hafnium Oxide as the Gate Dielectric
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Low-Operating-Voltage Polymer Thin-Film Transistors Based on Poly(3-Hexylthiophene) With Hafnium Oxide as the Gate Dielectric

Liu, Y R ; Deng, L F ; Yao, R H ; Lai, P T

IEEE transactions on device and materials reliability, 2010-06, Vol.10 (2), p.233-237 [Periódico revisado por pares]

New York: IEEE

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7
Routing Correlated Data with Fusion Cost in Wireless Sensor Networks
Routing Correlated Data with Fusion Cost in Wireless Sensor Networks
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Routing Correlated Data with Fusion Cost in Wireless Sensor Networks

Luo, H. ; Liu, Y. ; Das, S.K.

IEEE transactions on mobile computing, 2006-11, Vol.5 (11), p.1620-1632 [Periódico revisado por pares]

New York, NY: IEEE

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8
Pump Sizing and Selection Made Easy
Pump Sizing and Selection Made Easy
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Pump Sizing and Selection Made Easy

Sarver, Joseph ; Finkenauer, Blake ; Liu, Y A

Chemical Engineering, 2018-01, Vol.125 (1), p.34-43

New York: Access Intelligence LLC

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9
Influence of Octadecyltrichlorosilane Surface Modification on Electrical Properties of Polymer Thin-Film Transistors Studied by Capacitance-Voltage Analysis
Influence of Octadecyltrichlorosilane Surface Modification on Electrical Properties of Polymer Thin-Film Transistors Studied by Capacitance-Voltage Analysis
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Influence of Octadecyltrichlorosilane Surface Modification on Electrical Properties of Polymer Thin-Film Transistors Studied by Capacitance-Voltage Analysis

Liu, Y R ; Lai, P T ; Yao, R H ; Deng, L F

IEEE transactions on device and materials reliability, 2011-03, Vol.11 (1), p.60-65 [Periódico revisado por pares]

New York: IEEE

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10
Up-to-Date Tools for Water-System Optimization
Up-to-Date Tools for Water-System Optimization
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Up-to-Date Tools for Water-System Optimization

Liu, YA ; Lucas, Bruce ; Mann, James

Chemical Engineering, 2004-01, Vol.111 (1), p.30-30

New York: Access Intelligence LLC

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