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11
'0 0' Gauge Layout and Design
'0 0' Gauge Layout and Design
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'0 0' Gauge Layout and Design

The Railway and Locomotive Historical Society Bulletin, 1955 (93), p.137-138

The Railway & Locomotive Historical Society, Inc

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12
(0 0 l)-oriented Bi 2Sr 2Co 2O y and Ca 3Co 4O 9 films: Self-assembly orientation and growth mechanism by chemical solution deposition
(0 0 l)-oriented Bi 2Sr 2Co 2O y and Ca 3Co 4O 9 films: Self-assembly orientation and growth mechanism by chemical solution deposition
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(0 0 l)-oriented Bi 2Sr 2Co 2O y and Ca 3Co 4O 9 films: Self-assembly orientation and growth mechanism by chemical solution deposition

Zhu, Xuebin ; Shi, Dongqi ; Dou, Shixue ; Sun, Yuping ; Li, Qi ; Wang, Lin ; Li, Wenxian ; Yeoh, Weikong ; Zheng, Rongkun ; Chen, Zhixin ; Kong, Chunxiu

Acta materialia, 2010, Vol.58 (12), p.4281-4291 [Peer Reviewed Journal]

Elsevier Ltd

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13
0-0.com
0-0.com
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0-0.com

Online (Weston, Conn.), 2000-01, Vol.24 (1), p.13-13

Information Today, Inc

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14
0.0 Order and disorder in the world of atoms: VonA. I. Kifaigorodskiy. Herausgeg. vonS. Chomet. VIII/185 S., 71 Abb. Format: 15,5×23 cm. Berlin/Heidelberg/New York 1967: Springer. Preis: Kart. DM 11,20: US 2.80 S
0.0 Order and disorder in the world of atoms: VonA. I. Kifaigorodskiy. Herausgeg. vonS. Chomet. VIII/185 S., 71 Abb. Format: 15,5×23 cm. Berlin/Heidelberg/New York 1967: Springer. Preis: Kart. DM 11,20: US 2.80 S
Material Type:
Article 		Add to e-Shelf

0.0 Order and disorder in the world of atoms: VonA. I. Kifaigorodskiy. Herausgeg. vonS. Chomet. VIII/185 S., 71 Abb. Format: 15,5×23 cm. Berlin/Heidelberg/New York 1967: Springer. Preis: Kart. DM 11,20: US 2.80 S

Kollmann, F.

European journal of wood and wood products, 1971-06, Vol.29 (6), p.240-240

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15
0.00035 mm2 on-chip leakage sensing unit for various devices in 10 nm FinFET process
0.00035 mm2 on-chip leakage sensing unit for various devices in 10 nm FinFET process
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0.00035 mm2 on-chip leakage sensing unit for various devices in 10 nm FinFET process

Oh, G.-G ; Lee, Y.-W ; Lee, B

Electronics letters, 2018-02, Vol.54 (4), p.213-215 [Peer Reviewed Journal]

The Institution of Engineering and Technology

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16
0.00035 mm 2 on‐chip leakage sensing unit for various devices in 10 nm FinFET process
0.00035 mm 2 on‐chip leakage sensing unit for various devices in 10 nm FinFET process
Material Type:
Article 		Add to e-Shelf

0.00035 mm 2 on‐chip leakage sensing unit for various devices in 10 nm FinFET process

Oh, G.‐G. ; Lee, Y.‐W. ; Lee, B.

Electronics letters, 2018-02, Vol.54 (4), p.213-215 [Peer Reviewed Journal]

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17
[0001] Compression response at room temperature of single-crystal magnesium
[0001] Compression response at room temperature of single-crystal magnesium
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[0001] Compression response at room temperature of single-crystal magnesium

Syed, B. ; Geng, J. ; Mishra, R.K. ; Kumar, K.S.

Scripta materialia, 2012-10, Vol.67 (7-8), p.700-703 [Peer Reviewed Journal]

Elsevier Ltd

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18
0.0012 mm super( 2), 8 mW, single-to-differential converter with < 1.1% data cross error and < 3.4 ps RMS jitter up to 14 Gbit/s data rate
0.0012 mm super( 2), 8 mW, single-to-differential converter with < 1.1% data cross error and < 3.4 ps RMS jitter up to 14 Gbit/s data rate
Material Type:
Article 		Add to e-Shelf

0.0012 mm super( 2), 8 mW, single-to-differential converter with < 1.1% data cross error and < 3.4 ps RMS jitter up to 14 Gbit/s data rate

Chen, Yong ; Mak, Pui-In ; Zhang, Li ; Qian, He ; Wang, Yan

Electronics letters, 2013-05, Vol.49 (11), p.1-1 [Peer Reviewed Journal]

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19
0.0012 mm2, 8 mW, single-to-differential converter with &lt; 1.1% data cross error and &lt; 3.4 ps RMS jitter up to 14 Gbit/s data rate
0.0012 mm2, 8 mW, single-to-differential converter with &lt; 1.1% data cross error and &lt; 3.4 ps RMS jitter up to 14 Gbit/s data rate
Material Type:
Article 		Add to e-Shelf

0.0012 mm2, 8 mW, single-to-differential converter with < 1.1% data cross error and < 3.4 ps RMS jitter up to 14 Gbit/s data rate

Chen, Yong ; Mak, Pui-In ; Zhang, Li ; Qian, He ; Wang, Yan

Electronics letters, 2013-05, Vol.49 (11), p.692-694 [Peer Reviewed Journal]

Stevenage: The Institution of Engineering and Technology

Full text available

Citations Cited by
20
0.0012 mm^sup 2^, 8 mW, single-to-differential converter with &lt; 1.1% data cross error and &lt; 3.4 ps RMS jitter up to 14 Gbit/s data rate
0.0012 mm^sup 2^, 8 mW, single-to-differential converter with &lt; 1.1% data cross error and &lt; 3.4 ps RMS jitter up to 14 Gbit/s data rate
Material Type:
Article 		Add to e-Shelf

0.0012 mm^sup 2^, 8 mW, single-to-differential converter with < 1.1% data cross error and < 3.4 ps RMS jitter up to 14 Gbit/s data rate

Chen, Yong ; Mak, Pui-In ; Zhang, Li ; Qian, He ; Wang, Yan

Electronics letters, 2013-05, Vol.49 (11), p.1 [Peer Reviewed Journal]

Stevenage: John Wiley & Sons, Inc

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