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Material Type: Artigo
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A next generation ultra short pulse reflectometry (USPR) diagnosticDomier, C. W. ; Zhu, Y. ; Dannenberg, J. ; Luhmann, N. C.Review of scientific instruments, 2021-03, Vol.92 (3), p.034714-034714 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Design and characterization of a 32-channel heterodyne radiometer for electron cyclotron emission measurements on experimental advanced superconducting tokamakHan, X ; Liu, X ; Liu, Y ; Domier, C W ; Luhmann, Jr, N C ; Li, E Z ; Hu, L Q ; Gao, XReview of scientific instruments, 2014-07, Vol.85 (7), p.073506-073506 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Synthetic diagnostic for electron cyclotron emission imagingChen, M. ; Zhu, Y. ; Luo, C. ; Shi, L. ; Tobias, B. J. ; Luhmann, N. C.Review of scientific instruments, 2018-10, Vol.89 (10), p.10H117-10H117 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Diagnosing the pedestal magnetic field and magnetohydrodynamics radial structure with pedestal–scrape of layer electron cyclotron emission radiation inversion in H-mode plasma (invited)Yu, G. ; Zhu, Y. ; Austin, M. ; Chen, Y. ; Cao, J. ; Diallo, A. ; Kramer, G. ; Li, Z. ; Li, X. ; Liu, X. ; Nazikian, R. ; Zheng, Y. ; Luhmann, N. C.Review of scientific instruments, 2022-10, Vol.93 (10), p.103528-103528 [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Development of KSTAR ECE imaging system for measurement of temperature fluctuations and edge density fluctuationsYun, G S ; Lee, W ; Choi, M J ; Kim, J B ; Park, H K ; Domier, C W ; Tobias, B ; Liang, T ; Kong, X ; Luhmann, Jr, N C ; Donné, A J HReview of scientific instruments, 2010-10, Vol.81 (10), p.10D930-10D930 [Periódico revisado por pares]United StatesTexto completo disponível |
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Material Type: Artigo
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Development of electron cyclotron emission imaging system on the HL-2A tokamakJiang, M ; Shi, Z B ; Che, S ; Domier, C W ; Luhmann, Jr, N C ; Hu, X ; Spear, A ; Liu, Z T ; Ding, X T ; Li, J ; Zhong, W L ; Chen, W ; Che, Y L ; Fu, B Z ; Cui, Z Y ; Sun, P ; Liu, Y ; Yang, Q W ; Duan, X RReview of scientific instruments, 2013-11, Vol.84 (11), p.113501-113501 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Quasi 3D ECE imaging system for study of MHD instabilities in KSTARYun, G S ; Lee, W ; Choi, M J ; Lee, J ; Kim, M ; Leem, J ; Nam, Y ; Choe, G H ; Park, H K ; Park, H ; Woo, D S ; Kim, K W ; Domier, C W ; Luhmann, Jr, N C ; Ito, N ; Mase, A ; Lee, S GReview of scientific instruments, 2014-11, Vol.85 (11), p.11D820-11D820 [Periódico revisado por pares]United StatesTexto completo disponível |
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Material Type: Artigo
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The high-k poloidal scattering system for NSTX-UBarchfeld, R. ; Domier, C. W. ; Ren, Y. ; Ellis, R. ; Riemenschneider, P. ; Allen, N. ; Kaita, R. ; Stratton, B. ; Dannenberg, J. ; Zhu, Y. ; Luhmann, N. C.Review of scientific instruments, 2018-10, Vol.89 (10), p.10C114-10C114 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Integrated package of electron cyclotron emission imaging data processing and forward modeling in OMFITYu, G. ; Zhu, Y. ; Wang, Y. ; Meneghini, O. ; Smith, S. P. ; Zou, Y. ; Luo, C. ; Cao, J. ; Tobias, B. ; Diallo, A. ; Kramer, G. J. ; Ren, Y. ; Luhmann, N. C.Review of scientific instruments, 2021-03, Vol.92 (3), p.033540-033540 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
10 |
Material Type: Artigo
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Commissioning of electron cyclotron emission imaging instrument on the DIII-D tokamak and first dataTobias, B ; Domier, C W ; Liang, T ; Kong, X ; Yu, L ; Yun, G S ; Park, H K ; Classen, I G J ; Boom, J E ; Donné, A J H ; Munsat, T ; Nazikian, R ; Van Zeeland, M ; Boivin, R L ; Luhmann, Jr, N CReview of scientific instruments, 2010-10, Vol.81 (10), p.10D928-10D928 [Periódico revisado por pares]United StatesTexto completo disponível |