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An Anonymous Authentication System for Pay-As-You-Go Cloud Computing
An Anonymous Authentication System for Pay-As-You-Go Cloud Computing
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An Anonymous Authentication System for Pay-As-You-Go Cloud Computing

Huang, Jianye ; Susilo, Willy ; Guo, Fuchun ; Wu, Ge ; Zhao, Zhen ; Huang, Qiong

IEEE transactions on dependable and secure computing, 2022-03, Vol.19 (2), p.1280-1291

Washington: IEEE

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2
The Duality in Computing SSA Programs and Control Dependency
The Duality in Computing SSA Programs and Control Dependency
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The Duality in Computing SSA Programs and Control Dependency

Masud, Abu Naser

IEEE transactions on software engineering, 2023-04, Vol.49 (4), p.1766-1781 [Periódico revisado por pares]

New York: IEEE

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3
Comments on "Using kk-Core Decomposition on Class Dependency Networks to Improve Bug Prediction Model's Practical Performance"
Comments on "Using kk-Core Decomposition on Class Dependency Networks to Improve Bug Prediction Model's Practical Performance"
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Comments on "Using kk-Core Decomposition on Class Dependency Networks to Improve Bug Prediction Model's Practical Performance"

Pan, Weifeng ; Ming, Hua ; Yang, Zijiang ; Wang, Tian

IEEE transactions on software engineering, 2022-12, Vol.48 (12), p.5176-5187 [Periódico revisado por pares]

IEEE

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4
Efficient and Privacy-Preserving Similarity Range Query Over Encrypted Time Series Data
Efficient and Privacy-Preserving Similarity Range Query Over Encrypted Time Series Data
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Efficient and Privacy-Preserving Similarity Range Query Over Encrypted Time Series Data

Zheng, Yandong ; Lu, Rongxing ; Guan, Yunguo ; Shao, Jun ; Zhu, Hui

IEEE transactions on dependable and secure computing, 2022-07, Vol.19 (4), p.2501-2516

Washington: IEEE

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5
The g -Good-Neighbor Conditional Diagnosability of Arrangement Graphs
The g -Good-Neighbor Conditional Diagnosability of Arrangement Graphs
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The g -Good-Neighbor Conditional Diagnosability of Arrangement Graphs

Lin, Limei ; Xu, Li ; Wang, Dajin ; Zhou, Shuming

IEEE transactions on dependable and secure computing, 2018-05, Vol.15 (3), p.542-548

IEEE

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6
The ManyBugs and IntroClass Benchmarks for Automated Repair of C Programs
The ManyBugs and IntroClass Benchmarks for Automated Repair of C Programs
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The ManyBugs and IntroClass Benchmarks for Automated Repair of C Programs

Le Goues, Claire ; Holtschulte, Neal ; Smith, Edward K. ; Brun, Yuriy ; Devanbu, Premkumar ; Forrest, Stephanie ; Weimer, Westley

IEEE transactions on software engineering, 2015-12, Vol.41 (12), p.1236-1256 [Periódico revisado por pares]

New York: IEEE

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7
Conditional Diagnosability of (n,k) -Star Graphs Under the PMC Model
Conditional Diagnosability of (n,k) -Star Graphs Under the PMC Model
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Conditional Diagnosability of (n,k) -Star Graphs Under the PMC Model

Chang, Nai-Wen ; Hsieh, Sun-Yuan

IEEE transactions on dependable and secure computing, 2018-03, Vol.15 (2), p.207-216

Washington: IEEE

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8
A Formal Specification and Verification Framework for Timed Security Protocols
A Formal Specification and Verification Framework for Timed Security Protocols
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A Formal Specification and Verification Framework for Timed Security Protocols

Li, Li ; Sun, Jun ; Liu, Yang ; Sun, Meng ; Dong, Jin-Song

IEEE transactions on software engineering, 2018-08, Vol.44 (8), p.725-746 [Periódico revisado por pares]

New York: IEEE

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9
K-ST: A Formal Executable Semantics of the Structured Text Language for PLCs
K-ST: A Formal Executable Semantics of the Structured Text Language for PLCs
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K-ST: A Formal Executable Semantics of the Structured Text Language for PLCs

Wang, Kun ; Wang, Jingyi ; Poskitt, Christopher M. ; Chen, Xiangxiang ; Sun, Jun ; Cheng, Peng

IEEE transactions on software engineering, 2023-10, Vol.49 (10), p.4796-4813 [Periódico revisado por pares]

New York: IEEE

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10
Looking For Novelty in Search-Based Software Product Line Testing
Looking For Novelty in Search-Based Software Product Line Testing
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Looking For Novelty in Search-Based Software Product Line Testing

Xiang, Yi ; Huang, Han ; Li, Miqing ; Li, Sizhe ; Yang, Xiaowei

IEEE transactions on software engineering, 2022-07, Vol.48 (7), p.2317-2338 [Periódico revisado por pares]

New York: IEEE

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