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Study of Mo-, Au-, and Ni-implanted molybdenum laser mirrors by multiple angle of incidence spectroscopic ellipsometry
Study of Mo-, Au-, and Ni-implanted molybdenum laser mirrors by multiple angle of incidence spectroscopic ellipsometry
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Study of Mo-, Au-, and Ni-implanted molybdenum laser mirrors by multiple angle of incidence spectroscopic ellipsometry

SNYDER, P. G ; ROST, M. C ; BU-ABBUD, G. H ; OH, J ; WOOLLAM, J. A ; POKER, D ; ASPNES, D. E ; INGRAM, D ; PRONKO, P

Journal of applied physics, 1986-07, Vol.60 (2), p.779-788 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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2
Variable angle of incidence spectroscopic ellipsometry: application to GaAs-AlxGa1-xAs multiple heterostructures
Variable angle of incidence spectroscopic ellipsometry: application to GaAs-AlxGa1-xAs multiple heterostructures
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Variable angle of incidence spectroscopic ellipsometry: application to GaAs-AlxGa1-xAs multiple heterostructures

SNYDER, P. G ; ROST, M. C ; BU-ABBUD, G. H ; WOOLLAM, J. A ; ALTEROVITZ, S. A

Journal of applied physics, 1986-11, Vol.60 (9), p.3293-3302 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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3
Variable wavelength, variable angle ellipsometry including a sensitivities correlation test
Variable wavelength, variable angle ellipsometry including a sensitivities correlation test
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Variable wavelength, variable angle ellipsometry including a sensitivities correlation test

Bu-Abbud, G.H. ; Bashara, N.M. ; Woollam, John A.

Thin solid films, 1986-04, Vol.138 (1), p.27-41 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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4
Structural and Chemical Analysis of a Silicon Nitride Film on GaAs by Null Ellipsometry
Structural and Chemical Analysis of a Silicon Nitride Film on GaAs by Null Ellipsometry
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Structural and Chemical Analysis of a Silicon Nitride Film on GaAs by Null Ellipsometry

Alterovitz, S. A. ; Bu-Abbud, G. H. ; Woollam, J. A. ; Liu, D. C.

Physica status solidi. A, Applied research, 1984-09, Vol.85 (1), p.69-76

Berlin: WILEY-VCH Verlag

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5
Roughness studies of ion beam processed molybdenum surfaces
Roughness studies of ion beam processed molybdenum surfaces
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Roughness studies of ion beam processed molybdenum surfaces

BU-ABBUD, G. H ; MATHINE, D. L ; SNYDER, P ; WOOLLAM, J. A ; POKER, D ; BENNETT, J ; INGRAM, D ; PRONKO, P. P

Journal of applied physics, 1986, Vol.59 (1), p.257-262 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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6
Mass density and hydrogen concentration in “diamond-like” carbon films: Proton recoil, Rutherford backscattering and ellipsometric analysis
Mass density and hydrogen concentration in “diamond-like” carbon films: Proton recoil, Rutherford backscattering and ellipsometric analysis
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Mass density and hydrogen concentration in “diamond-like” carbon films: Proton recoil, Rutherford backscattering and ellipsometric analysis

Ingram, David C. ; Woollam, John A. ; Bu-Abbud, George

Thin solid films, 1986-01, Vol.137 (2), p.225-230 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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7
Analytic solutions for optimized ellipsometric measurements
Analytic solutions for optimized ellipsometric measurements
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Analytic solutions for optimized ellipsometric measurements

ALTEROVITZ, S. A ; BU-ABBUD, G. H ; WOOLLAM, J. A

Thin solid films, 1985, Vol.123 (3), p.183-195 [Periódico revisado por pares]

Lausanne: Elsevier Science

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