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ASTRA: astrometry and phase-referencing astronomy on the Keck interferometer
ASTRA: astrometry and phase-referencing astronomy on the Keck interferometer
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Ata de Congresso 		Adicionar ao Meu Espaço

ASTRA: astrometry and phase-referencing astronomy on the Keck interferometer

Woillez, J ; Akeson, R ; Colavita, M ; Eisner, J ; Ghez, A ; Graham, J ; Hillenbrand, L ; Millan-Gabet, R ; Monnier, J ; Pott, J-U ; Ragland, S ; Wizinowich, P ; Appleby, E ; Berkey, B ; Cooper, A ; Felizardo, C ; Herstein, J ; Hrynevych, M ; Martin, O ; Medeiros, D ; Morrison, D ; Panteleeva, T ; Smith, B ; Summers, K ; Tsubota, K ; Tyau, C ; Wetherell, E

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7734, p.773412-773412-10

Bellingham, Wash: SPIE

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2
Morphological signatures and genomic correlates in glioblastoma
Morphological signatures and genomic correlates in glioblastoma
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Morphological signatures and genomic correlates in glioblastoma

Cooper, L A D ; Jun Kong ; Fusheng Wang ; Kurc, T ; Moreno, C S ; Brat, D J ; Saltz, J H

2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 2011, p.1624-1627

IEEE

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3
Recent progress at the Keck Interferometer
Recent progress at the Keck Interferometer
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Recent progress at the Keck Interferometer

Ragland, S ; Akeson, R ; Colavita, M ; Millan-Gabet, R ; Woillez, J ; Wizinowich, P ; Appleby, E ; Berkey, B ; Cooper, A ; Felizardo, C ; Herstein, J ; Hrynevych, M ; Medeiros, D ; Morrison, D ; Panteleeva, T ; Pott, J.-U ; Smith, B ; Summers, K ; Tsubota, K ; Tyau, C ; Wetherell, E

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7734, p.773402-773402-12

Bellingham, Wash: SPIE

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4
Robustness of coherent SPE-OCDMA to combined dispersion impairments
Robustness of coherent SPE-OCDMA to combined dispersion impairments
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Robustness of coherent SPE-OCDMA to combined dispersion impairments

Yi Yang ; Cooper, A. Brinton ; Khurgin, Jacob B. ; Kang, Jin U.

CLEO: 2011 - Laser Science to Photonic Applications, 2011, p.1-2

IEEE

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5
Development of a diesel generating set model for large voltage and frequency transients
Development of a diesel generating set model for large voltage and frequency transients
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Development of a diesel generating set model for large voltage and frequency transients

Cooper, A R ; Morrow, D J ; Chambers, K D R

IEEE PES General Meeting, 2010, p.1-7

IEEE

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6
Transdisciplinary Engineering Versus Transdisciplinary Research: Differences, Similarities, Lessons and Opportunities
Transdisciplinary Engineering Versus Transdisciplinary Research: Differences, Similarities, Lessons and Opportunities
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Transdisciplinary Engineering Versus Transdisciplinary Research: Differences, Similarities, Lessons and Opportunities

Cooper, A

IOS Press 2023

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7
First Keck Interferometer measurements in self-phase referencing mode: spatially resolving circum-stellar line emission of 48 Lib
First Keck Interferometer measurements in self-phase referencing mode: spatially resolving circum-stellar line emission of 48 Lib
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First Keck Interferometer measurements in self-phase referencing mode: spatially resolving circum-stellar line emission of 48 Lib

Pott, J-U ; Woillez, J ; Ragland, S ; Wizinowich, P. L ; Eisner, J. A ; Monnier, J. D ; Akeson, R. L ; Ghez, A. M ; Graham, J. R ; Hillenbrand, L. A ; Millan-Gabet, R ; Appleby, E ; Berkey, B ; Colavita, M. M ; Cooper, A ; Felizardo, C ; Herstein, J ; Hrynevych, M ; Medeiros, D ; Morrison, D ; Panteleeva, T ; Smith, B ; Summers, K ; Tsubota, K ; Tyau, C ; Wetherell, E

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7734, p.77340P-77340P-6

Bellingham, Wash: SPIE

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8
On the Parameterized Complexity for Token Jumping on Graphs
On the Parameterized Complexity for Token Jumping on Graphs
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On the Parameterized Complexity for Token Jumping on Graphs

Ito, Takehiro ; Kamiński, Marcin ; Ono, Hirotaka ; Suzuki, Akira ; Uehara, Ryuhei ; Yamanaka, Katsuhisa Gopal, T. V. ; Agrawal, Manindra ; Cooper, S. Barry ; Li, Angsheng

Theory and Applications of Models of Computation, 2014, p.341-351 [Periódico revisado por pares]

Cham: Springer International Publishing

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9
Electrical evidence of disorder at the SiO2/4H-SiC MOS interface and its effect on electron transport
Electrical evidence of disorder at the SiO2/4H-SiC MOS interface and its effect on electron transport
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Electrical evidence of disorder at the SiO2/4H-SiC MOS interface and its effect on electron transport

Swandono, S. ; Penumatcha, A. ; Cooper, J. A.

70th Device Research Conference, 2012, p.167-168

IEEE

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10
SiC bipolar integrated circuits on semi-insulating substrates
SiC bipolar integrated circuits on semi-insulating substrates
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SiC bipolar integrated circuits on semi-insulating substrates

Singh, S. ; Cooper, J.A.

2009 Device Research Conference, 2009, p.273-274

IEEE

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