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Electron Flows Formed by Electron-Optical Systems Using Composite Field Emitters Made of Thermally Expanded Graphite and Diamond-Graphite Mixtures
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Electron Flows Formed by Electron-Optical Systems Using Composite Field Emitters Made of Thermally Expanded Graphite and Diamond-Graphite Mixtures

Gordeev, S. ; Sezonov, V. ; Sominskii, G. ; Taradaev, E. ; Taradaev, S.

IEEE transactions on electron devices, 2023-10, Vol.70 (10), p.1-5 [Peer Reviewed Journal]

IEEE

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2
An Efficient Nonlocal Hot Electron Model Accounting for Electron-Electron Scattering
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An Efficient Nonlocal Hot Electron Model Accounting for Electron-Electron Scattering

Zaka, A. ; Palestri, P. ; Rafhay, Q. ; Clerc, R. ; Iellina, M. ; Rideau, D. ; Tavernier, C. ; Pananakakis, G. ; Jaouen, H. ; Selmi, L.

IEEE transactions on electron devices, 2012-04, Vol.59 (4), p.983-993 [Peer Reviewed Journal]

New York, NY: IEEE

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3
PIC Simulation of Pseudospark Discharge- Based Plasma Cathode Electron Source for the Generation of High Current Density and Energetic Electron Beam
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PIC Simulation of Pseudospark Discharge- Based Plasma Cathode Electron Source for the Generation of High Current Density and Energetic Electron Beam

Varun ; Cross, A. W. ; Ronald, K. ; Pal, Udit Narayan

IEEE transactions on electron devices, 2020-04, Vol.67 (4), p.1-4 [Peer Reviewed Journal]

New York: IEEE

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4
IEEE ELECTRON DEVICES SOCIETY
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IEEE ELECTRON DEVICES SOCIETY

IEEE transactions on electron devices, 2024-07, Vol.71 (7), p.C2-C2 [Peer Reviewed Journal]

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5
IEEE ELECTRON DEVICES SOCIETY
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IEEE ELECTRON DEVICES SOCIETY

IEEE transactions on electron devices, 2024-06, Vol.71 (6), p.C2-C2 [Peer Reviewed Journal]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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6
Experimental Investigation on Trapped Electrons Oscillation Suppression for W-Band Gyro-TWT
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Experimental Investigation on Trapped Electrons Oscillation Suppression for W-Band Gyro-TWT

Han, Binyang ; Jiang, Wei ; Wang, Jianxun ; Lu, Chaoxuan ; Dai, Boxin ; Yao, Yelei ; Liu, Guo ; Xu, Jianhua ; Luo, Yong

IEEE transactions on electron devices, 2024-06, Vol.71 (6), p.3921-3926 [Peer Reviewed Journal]

New York: IEEE

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7
IEEE ELECTRON DEVICES SOCIETY
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IEEE ELECTRON DEVICES SOCIETY

IEEE transactions on electron devices, 2024-05, Vol.71 (5), p.C2-C2 [Peer Reviewed Journal]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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8
IEEE ELECTRON DEVICES SOCIETY
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IEEE ELECTRON DEVICES SOCIETY

IEEE transactions on electron devices, 2024-04, Vol.71 (4), p.C2-C2 [Peer Reviewed Journal]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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9
IEEE ELECTRON DEVICES SOCIETY
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IEEE ELECTRON DEVICES SOCIETY

IEEE transactions on electron devices, 2024-03, Vol.71 (3), p.C2-C2 [Peer Reviewed Journal]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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10
IEEE ELECTRON DEVICES SOCIETY
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IEEE ELECTRON DEVICES SOCIETY

IEEE transactions on electron devices, 2024-02, Vol.71 (2), p.C2-C2 [Peer Reviewed Journal]

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