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1
Thermal noise calibration of functionalized cantilevers for force microscopy: Effects of the colloidal probe position
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Thermal noise calibration of functionalized cantilevers for force microscopy: Effects of the colloidal probe position

Archambault, Aubin ; Crauste-Thibierge, Caroline ; Bellon, Ludovic

Journal of applied physics, 2024-03, Vol.135 (9) [Periódico revisado por pares]

Melville: American Institute of Physics

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2
Microdosimetry of electrons in liquid water using the low-energy models of Geant4
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Microdosimetry of electrons in liquid water using the low-energy models of Geant4

Kyriakou, I. ; Emfietzoglou, D. ; Ivanchenko, V. ; Bordage, M. C. ; Guatelli, S. ; Lazarakis, P. ; Tran, H. N. ; Incerti, S.

Journal of applied physics, 2017-07, Vol.122 (2) [Periódico revisado por pares]

Melville: American Institute of Physics

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3
A bright future for silicon in quantum technologies
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A bright future for silicon in quantum technologies

Khoury, Mario ; Abbarchi, Marco

Journal of applied physics, 2022-05, Vol.131 (20) [Periódico revisado por pares]

Melville: American Institute of Physics

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4
Evaluation of the influence of physical and chemical parameters on water radiolysis simulations under MeV electron irradiation using Geant4-DNA
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Evaluation of the influence of physical and chemical parameters on water radiolysis simulations under MeV electron irradiation using Geant4-DNA

Shin, W.-G. ; Ramos-Mendez, J. ; Faddegon, B. ; Tran, H. N. ; Villagrasa, C. ; Perrot, Y. ; Okada, S. ; Karamitros, M. ; Emfietzoglou, D. ; Kyriakou, I. ; Bordage, M. C. ; Sakata, D. ; Guatelli, S. ; Choi, H. J. ; Min, C. H. ; Lee, S. B. ; Incerti, S.

Journal of applied physics, 2019-09, Vol.126 (11) [Periódico revisado por pares]

Melville: American Institute of Physics

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5
Cryogenic optomechanic cavity in low mechanical loss material
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Cryogenic optomechanic cavity in low mechanical loss material

Bon, Jérémy ; Neuhaus, Leonhard ; Deléglise, Samuel ; Briant, Tristan ; Abbé, Philippe ; Cohadon, Pierre-François ; Galliou, Serge

Journal of applied physics, 2018-08, Vol.124 (7) [Periódico revisado por pares]

Melville: American Institute of Physics

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6
Fourier-correlation imaging
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Fourier-correlation imaging

Braun, Daniel ; Monjid, Younes ; Rougé, Bernard ; Kerr, Yann

Journal of applied physics, 2018-02, Vol.123 (7) [Periódico revisado por pares]

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7
Track structure simulations of proximity functions in liquid water using the Geant4-DNA toolkit
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Track structure simulations of proximity functions in liquid water using the Geant4-DNA toolkit

Incerti, S. ; Kyriakou, I. ; Bordage, M. C. ; Guatelli, S. ; Ivanchenko, V. ; Emfietzoglou, D.

Journal of applied physics, 2019-03, Vol.125 (10) [Periódico revisado por pares]

Melville: American Institute of Physics

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8
Magnetic sensitivity of the microwave cryogenic sapphire oscillator
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Magnetic sensitivity of the microwave cryogenic sapphire oscillator

Giordano, Vincent ; Fluhr, Christophe ; Dubois, Benoit

Journal of applied physics, 2020-05, Vol.127 (18) [Periódico revisado por pares]

Melville: American Institute of Physics

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9
Calculation of lineal energies for water and DNA bases using the Rudd model cross sections integrated within the Geant4-DNA processes
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Calculation of lineal energies for water and DNA bases using the Rudd model cross sections integrated within the Geant4-DNA processes

Francis, Z. ; El Bitar, Z. ; Incerti, S. ; Bernal, M. A. ; Karamitros, M. ; Tran, H. N.

Journal of applied physics, 2017-07, Vol.122 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

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10
Role of temperature in the radiation stability of yttria stabilized zirconia under swift heavy ion irradiation: A study from the perspective of nuclear reactor applications
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Role of temperature in the radiation stability of yttria stabilized zirconia under swift heavy ion irradiation: A study from the perspective of nuclear reactor applications

Kalita, Parswajit ; Ghosh, Santanu ; Sattonnay, Gaël ; Singh, Udai B. ; Grover, Vinita ; Shukla, Rakesh ; Amirthapandian, S. ; Meena, Ramcharan ; Tyagi, A. K. ; Avasthi, Devesh K.

Journal of applied physics, 2017-07, Vol.122 (2) [Periódico revisado por pares]

Melville: American Institute of Physics

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