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Nanoscale n++-p junction formation in GeOI probed by tip-enhanced Raman spectroscopy and conductive atomic force microscopyPrucnal, Slawomir ; Berencén, Yonder ; Wang, Mao ; Georgiev, Yordan M. ; Erbe, Artur ; Khan, Muhammad B. ; Boettger, Roman ; Hübner, René ; Schönherr, Tommy ; Kalbacova, Jana ; Vines, Lasse ; Facsko, Stefan ; Engler, Martin ; Zahn, Dietrich R. T. ; Knoch, Joachim ; Helm, Manfred ; Skorupa, Wolfgang ; Zhou, ShengqiangJournal of applied physics, 2019-06, Vol.125 (24) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |