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Design of broadband high-efficiency superconducting-nanowire single photon detectors
Design of broadband high-efficiency superconducting-nanowire single photon detectors
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Design of broadband high-efficiency superconducting-nanowire single photon detectors

Redaelli, L ; Bulgarini, G ; Dobrovolskiy, S ; Dorenbos, S N ; Zwiller, V ; Monroy, E ; Gérard, J M

Superconductor science & technology, 2016-06, Vol.29 (6), p.65016-65024 [Periódico revisado por pares]

IOP Publishing

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2
Chemical stability and superconductivity in Ag-sheathed CaKFe4As4 superconducting tapes
Chemical stability and superconductivity in Ag-sheathed CaKFe4As4 superconducting tapes
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Chemical stability and superconductivity in Ag-sheathed CaKFe4As4 superconducting tapes

Cheng, Zhe ; Dong, Chiheng ; Huang, He ; Liu, Shifa ; Zhu, Yanchang ; Wang, Dongliang ; Vlasko-Vlasov, Vitalii ; Welp, Ulrich ; Kwok, Wai-Kwong ; Ma, Yanwei

Superconductor science & technology, 2018-11, Vol.32 (1) [Periódico revisado por pares]

United States: IOP Publishing

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3
An intermetallic powder-in-tube approach to increased flux-pinning in Nb3Sn by internal oxidation of Zr
An intermetallic powder-in-tube approach to increased flux-pinning in Nb3Sn by internal oxidation of Zr
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An intermetallic powder-in-tube approach to increased flux-pinning in Nb3Sn by internal oxidation of Zr

Motowidlo, L R ; Lee, P J ; Tarantini, C ; Balachandran, S ; Ghosh, A K ; Larbalestier, D C

Superconductor science & technology, 2017-11, Vol.31 (1) [Periódico revisado por pares]

United States: IOP Publishing

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4
Evaluation of critical current density and residual resistance ratio limits in powder in tube Nb3Sn conductors
Evaluation of critical current density and residual resistance ratio limits in powder in tube Nb3Sn conductors
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Evaluation of critical current density and residual resistance ratio limits in powder in tube Nb3Sn conductors

Segal, Christopher ; Tarantini, Chiara ; Sung, Zu Hawn ; Lee, Peter J ; Sailer, Bernd ; Thoener, Manfred ; Schlenga, Klaus ; Ballarino, Amalia ; Bottura, Luca ; Bordini, Bernardo ; Scheuerlein, Christian ; Larbalestier, David C

Superconductor science & technology, 2016-06, Vol.29 (8) [Periódico revisado por pares]

United States: IOP Publishing

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5
Controllable surface contact resistance in solution-processed thin-film transistors due to dimension modification
Controllable surface contact resistance in solution-processed thin-film transistors due to dimension modification
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Controllable surface contact resistance in solution-processed thin-film transistors due to dimension modification

Mondal, Sandip

Semiconductor science and technology, 2020-10, Vol.35 (10), p.10 [Periódico revisado por pares]

IOP Publishing

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6
Interlaboratory determination of the calibration factor for the measurement of the interstitial oxygen content of silicon by infrared absorption
Interlaboratory determination of the calibration factor for the measurement of the interstitial oxygen content of silicon by infrared absorption
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Interlaboratory determination of the calibration factor for the measurement of the interstitial oxygen content of silicon by infrared absorption

BAGHDADI, A ; BULLIS, W. M ; CROARKIN, M. C ; YUE-ZHEN LI ; SCACE, R. I ; SERIES, R. W ; STALLHOFER, P ; WATANABE, M

Journal of the Electrochemical Society, 2019-12, Vol.136 (7), p.2015-2024 [Periódico revisado por pares]

Pennington, NJ: Electrochemical Society

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7
Review of carbon nanotube nanoelectronics and macroelectronics
Review of carbon nanotube nanoelectronics and macroelectronics
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Review of carbon nanotube nanoelectronics and macroelectronics

Che, Yuchi ; Chen, Haitian ; Gui, Hui ; Liu, Jia ; Liu, Bilu ; Zhou, Chongwu

Semiconductor science and technology, 2014-07, Vol.29 (7), p.73001 [Periódico revisado por pares]

IOP Publishing

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8
Shaping the spectrum of terahertz photoconductive antenna by frequency-dependent impedance modulation
Shaping the spectrum of terahertz photoconductive antenna by frequency-dependent impedance modulation
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Shaping the spectrum of terahertz photoconductive antenna by frequency-dependent impedance modulation

Lavrukhin, D V ; Yachmenev, A E ; Pavlov, A Yu ; Khabibullin, R A ; Goncharov, Yu G ; Spektor, I E ; Komandin, G A ; Yurchenko, S O ; Chernomyrdin, N V ; Zaytsev, K I ; Ponomarev, D S

Semiconductor science and technology, 2019-02, Vol.34 (3), p.34005 [Periódico revisado por pares]

IOP Publishing

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9
In situ metal-organic chemical vapour deposition growth of III-V semiconductor nanowires in the Lund environmental transmission electron microscope
In situ metal-organic chemical vapour deposition growth of III-V semiconductor nanowires in the Lund environmental transmission electron microscope
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In situ metal-organic chemical vapour deposition growth of III-V semiconductor nanowires in the Lund environmental transmission electron microscope

Hetherington, Crispin ; Jacobsson, Daniel ; Dick, Kimberly A ; Wallenberg, L Reine

Semiconductor science and technology, 2020-03, Vol.35 (3), p.34004 [Periódico revisado por pares]

IOP Publishing

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10
A review on the recent developments of solution processes for oxide thin film transistors
A review on the recent developments of solution processes for oxide thin film transistors
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A review on the recent developments of solution processes for oxide thin film transistors

Ahn, Byung Du ; Jeon, Hye-Ji ; Sheng, Jiazhen ; Park, Jozeph ; Park, Jin-Seong

Semiconductor science and technology, 2015-06, Vol.30 (6), p.64001 [Periódico revisado por pares]

IOP Publishing

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