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Temperature Influence on Tunnel Field Effect Transistors (TFETs) with Low Ambipolar Currents
Temperature Influence on Tunnel Field Effect Transistors (TFETs) with Low Ambipolar Currents
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Temperature Influence on Tunnel Field Effect Transistors (TFETs) with Low Ambipolar Currents

Martino, Marcio D. ; Der Agopian, Paula G. ; Dos Santos Filho, Sebastião G. ; Martino, João A.

ECS transactions, 2011, Vol.39 (1), p.77-84

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2
Analog Performance of Gate-Source/Drain Underlap Triple-Gate SOI nMOSFET
Analog Performance of Gate-Source/Drain Underlap Triple-Gate SOI nMOSFET
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Analog Performance of Gate-Source/Drain Underlap Triple-Gate SOI nMOSFET

Santos, Sara D. ; Nicoletti, Talitha ; Martino, João A.

ECS transactions, 2011, Vol.39 (1), p.239-246

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3
Cross-Section Features Influence on Surrounding MuGFETs
Cross-Section Features Influence on Surrounding MuGFETs
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Cross-Section Features Influence on Surrounding MuGFETs

Martino, Marcio ; Agopian, Paula ; Martino, João A.

ECS transactions, 2010, Vol.31 (1), p.91-98

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4
Formation of Nanoparticles in Organic Materials used in Semiconductors Optoelectronic Devices
Formation of Nanoparticles in Organic Materials used in Semiconductors Optoelectronic Devices
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Formation of Nanoparticles in Organic Materials used in Semiconductors Optoelectronic Devices

Guedes, André F. ; Costa, Eleani M. ; Guedes, Vilmar P.

ECS transactions, 2010, Vol.31 (1), p.231-236

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5
Atomic Scale Thickness Control of SOI Wafers for Fully Depleted Applications
Atomic Scale Thickness Control of SOI Wafers for Fully Depleted Applications
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Atomic Scale Thickness Control of SOI Wafers for Fully Depleted Applications

Schwarzenbach, Walter ; Daval, Nicolas ; Barec, Vincent ; Bonnin, Olivier ; Acosta-Alba, Pablo-Eduardo ; Maddalon, Catherine ; Chibko, Alexandre ; Robson, Timothy ; Nguyen, Bich-Yen ; Maleville, Christophe

ECS transactions, 2013, Vol.53 (5), p.39-46

The Electrochemical Society, Inc

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6
A Simulation Comparison between Junctionless and Inversion-Mode MuGFETs
A Simulation Comparison between Junctionless and Inversion-Mode MuGFETs
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A Simulation Comparison between Junctionless and Inversion-Mode MuGFETs

Colinge, Jean-Pierre ; Kranti, Abhinav ; Yan, Ran ; Ferain, Isabelle ; Dehdashti Akhavan, Nima ; Razavi, Pedram ; Lee, Chi-Woo ; Yu, Ran ; Colinge, Cindy

ECS transactions, 2011, Vol.35 (5), p.63-72

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7
Dopant-Free CMOS on SOI: Multi-Gate Si-Nanowire Transistors for Logic and Memory Applications
Dopant-Free CMOS on SOI: Multi-Gate Si-Nanowire Transistors for Logic and Memory Applications
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Dopant-Free CMOS on SOI: Multi-Gate Si-Nanowire Transistors for Logic and Memory Applications

Schwalke, Udo ; Krauss, Tillmann ; Wessely, Frank

ECS transactions, 2013, Vol.53 (5), p.105-114

The Electrochemical Society, Inc

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8
DIBL Study Using Triple Gate Unstrained and Uniaxial/Biaxial Strained FinFETs
DIBL Study Using Triple Gate Unstrained and Uniaxial/Biaxial Strained FinFETs
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DIBL Study Using Triple Gate Unstrained and Uniaxial/Biaxial Strained FinFETs

Santos, Sara D. ; Martino, João A. ; Simoen, Eddy ; Claeys, Cor

ECS transactions, 2009, Vol.23 (1), p.591-596

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9
Improved Analytical Model for ZTC Bias Point for Strained Tri-gates FinFETs
Improved Analytical Model for ZTC Bias Point for Strained Tri-gates FinFETs
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Improved Analytical Model for ZTC Bias Point for Strained Tri-gates FinFETs

Almeida, Luciano M. ; Martino, João A. ; Simoen, Eddy ; Claeys, Cor

ECS transactions, 2010, Vol.31 (1), p.385-392

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10
Analog Operation and Harmonic Distortion Temperature Dependence of nMOS Junctionless Transistors
Analog Operation and Harmonic Distortion Temperature Dependence of nMOS Junctionless Transistors
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Analog Operation and Harmonic Distortion Temperature Dependence of nMOS Junctionless Transistors

Doria, Rodrigo T. ; Pavanello, Marcelo A. ; Lee, Chi-Woo ; Ferain, Isabelle ; Dehdashti-Akhavan, Nima ; Yan, Ran ; Razavi, Pedram ; Yu, Ran ; Kranti, Abhinav ; Colinge, Jean-Pierre

ECS transactions, 2010, Vol.31 (1), p.13-20

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