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Design of ePixM, a fully-depleted monolithic CMOS active pixel sensor for soft X-ray experiments at LCLS-II
Design of ePixM, a fully-depleted monolithic CMOS active pixel sensor for soft X-ray experiments at LCLS-II
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Design of ePixM, a fully-depleted monolithic CMOS active pixel sensor for soft X-ray experiments at LCLS-II

Rota, L. ; Tamma, C. ; Segal, J.D. ; Caragiulo, P. ; Kenney, C. ; Dragone, A.

Journal of instrumentation, 2019-12, Vol.14 (12), p.C12014-C12014 [Periódico revisado por pares]

Bristol: IOP Publishing

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2
Highly-parallelized simulation of a pixelated LArTPC on a GPU
Highly-parallelized simulation of a pixelated LArTPC on a GPU
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Highly-parallelized simulation of a pixelated LArTPC on a GPU

Adamov, G. ; Adams, D. ; Aimard, B. ; Alton, A. ; Aurisano, A. ; Bambah, B. ; Basharina-Freshville, A. ; Behera, B. ; Bellettini, G. ; Benjamin, D. ; Betancourt, M. ; Bezerra, A.T. ; Chalifour, M. ; Chen, H. ; Chen-Wishart, Z. ; Cicero, V. ; Cui, Y. ; Cussans, D. ; De, K. ; Di Falco, S. ; Englezos, P. ; Flanagan, W. ; Friedland, A. ; Gallas, A. ; Gardiner, S. ; Gastler, D. ; Girerd, C. ; Granados, E. ; Groetschla, F.T. ; Guffanti, D. ; Haiston, J. ; Hayes, C. ; Holvey, T. ; Hostert, M. ; Howell, R. ; Hristova, I. ; Iles, G. ; Jackson, C.M. ; Jung, C.K. ; Kakorin, I. ; Kashur, L. ; Kearns, E. ; Kozhukalov, V. ; Kubu, M. ; Kumar, J. ; Lantwin, O. ; Laycock, P. ; Liu, Y. ; Machado, P. ; Madigan, P. ; Marchan, M. ; Marfatia, D. ; Marshall, C.M. ; Marshall, J. ; McFarland, K.S. ; McNab, A. ; Mena, O. ; Mills, J. ; Miranda, O.G. ; Mokhov, N. ; Mouster, G. ; Mu, W. ; Muraz, J. ; Nelson, M. ; Newcomer, M. ; Niner, E. ; Onishchuk, Y. ; Patrick, C. ; Peeters, S.J.M. ; Pershey, D. ; Poppi, F. ; Raut, S. ; Razakamiandra, R.F. ; Rincón, E.V. ; Santoro, D. ; Scarpelli, A. ; Schefke, T. ; Sinev, G. ; Singh Chauhan, S. ; Sokolov, S. ; Sousa, A. ; Spitz, J. ; Spooner, N.J.C. ; Stancari, M. ; Suter, L. ; Suvorov, Y. ; Tarpara, E. ; Thea, A. ; Todorović, N. ; Trzaska, W.H. ; Tsai, Y. ; Tsang, K.V. ; Tull, C. ; Tyler, J. ; Usher, T. ; Vaughan, N. ; Whilhelmi, J. ; Wilkinson, C. ; Zalesak, J. ; Zwaska, R.

Journal of instrumentation, 2023-04, Vol.18 (4), p.P04034 [Periódico revisado por pares]

Bristol: IOP Publishing

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3
Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
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Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1

Kanisauskas, K. ; Affolder, A. ; Arndt, K. ; Bates, R. ; Benoit, M. ; Bello, F. Di ; Blue, A. ; Bortoletto, D. ; Buckland, M. ; Buttar, C. ; Caragiulo, P. ; Das, D. ; Dopke, J. ; Dragone, A. ; Ehrler, F. ; Fadeyev, V. ; Galloway, Z. ; Grabas, H. ; Gregor, I.M. ; Grenier, P. ; Grillo, A. ; Hiti, B. ; Hoeferkamp, M. ; Hommels, L.B.A. ; Huffman, B.T. ; John, J. ; Kenney, C. ; Kramberger, J. ; Liang, Z. ; Mandic, I. ; Maneuski, D. ; Martinez-Mckinney, F. ; MacMahon, S. ; Meng, L. ; Mikuž, M. ; Muenstermann, D. ; Nickerson, R. ; Peric, I. ; Phillips, P. ; Plackett, R. ; Rubbo, F. ; Segal, J. ; Seidel, S. ; Seiden, A. ; Shipsey, I. ; Song, W. ; Staniztki, M. ; Su, D. ; Tamma, C. ; Turchetta, R. ; Vigani, L. ; Volk, J. ; Wang, R. ; Warren, M. ; Wilson, F. ; Worm, S. ; Xiu, Q. ; Zhang, J. ; Zhu, H.

Journal of instrumentation, 2017-02, Vol.12 (2), p.P02010-P02010 [Periódico revisado por pares]

United States: Institute of Physics (IOP)

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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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