Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Single layer chemically amplified resist processes for device fabrication by x‐ray lithographySeeger, D. ; Viswanathan, R. ; Blair, C. ; Gelorme, J. ; Conley, W.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1992, Vol.10 (6), p.2620-2627WOODBURY: Amer Inst PhysicsSem texto completo |
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2 |
Material Type: Ata de Congresso
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Plasma enhanced chemical vapor deposition silicon oxides as studied by x‐ray photoelectron spectroscopy, Rutherford backscattering, electron recoil detection analysis, infrared spectroscopy, and electron spin resonanceSindzingre, T. ; Ermolieff, A. ; Marthon, S. ; Martin, P. ; Pierre, F. ; Peccoud, L.Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1993, Vol.11 (4), p.1851-1857 [Periódico revisado por pares]Melville, NY: American Institute of PhysicsTexto completo disponível |
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3 |
Material Type: Ata de Congresso
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Radio‐frequency ion sources for space propulsion (invited)Groh, K. H. ; Loeb, H. W.Review of Scientific Instruments, 1992, Vol.63 (4), p.2513-2518 [Periódico revisado por pares]Woodbury, NY: American Institute of PhysicsTexto completo disponível |
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4 |
Material Type: Ata de Congresso
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Adsorption and decomposition of 2‐chloroethyl ethyl sulfide on Pt(111): A temperature programmed desorption and laser‐induced thermal desorption/Fourier transform mass spectrometry studyZhou, X.‐L. ; Sun, Z.‐J. ; White, J. M.Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1993, Vol.11 (4), p.2110-2116 [Periódico revisado por pares]Melville, NY: American Institute of PhysicsTexto completo disponível |