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Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 3. Pseudosymmetry
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 3. Pseudosymmetry
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Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 3. Pseudosymmetry

Nolze, Gert ; Tokarski, Tomasz ; Rychłowski, Łukasz

Journal of applied crystallography, 2023-04, Vol.56 (2), p.367-380 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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2
UnwarpCalculator: a utility to estimate intensity distribution in reciprocal space for an arbitrary 3D set of atoms
UnwarpCalculator: a utility to estimate intensity distribution in reciprocal space for an arbitrary 3D set of atoms
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UnwarpCalculator: a utility to estimate intensity distribution in reciprocal space for an arbitrary 3D set of atoms

Zakharov, Boris A.

Journal of applied crystallography, 2023-12, Vol.56 (6), p.1874-1878 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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3
EDP2PDF: a computer program for extracting a pair distribution function from an electron diffraction pattern for the structural analysis of materials
EDP2PDF: a computer program for extracting a pair distribution function from an electron diffraction pattern for the structural analysis of materials
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EDP2PDF: a computer program for extracting a pair distribution function from an electron diffraction pattern for the structural analysis of materials

Liu, Hongwei ; Nomoto, Keita ; Ceguerra, Anna V. ; Kruzic, Jamie J. ; Cairney, Julie ; Ringer, Simon P.

Journal of applied crystallography, 2023-06, Vol.56 (3), p.889-902 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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4
Direct derivation (DD) of weight fractions of individual crystalline phases from observed intensities and chemical composition data: incorporation of the DD method into the whole‐powder‐pattern fitting procedure
Direct derivation (DD) of weight fractions of individual crystalline phases from observed intensities and chemical composition data: incorporation of the DD method into the whole‐powder‐pattern fitting procedure
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Direct derivation (DD) of weight fractions of individual crystalline phases from observed intensities and chemical composition data: incorporation of the DD method into the whole‐powder‐pattern fitting procedure

Toraya, Hideo

Journal of applied crystallography, 2018-04, Vol.51 (2), p.446-455 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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5
EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patterns
EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patterns
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EDP2XRD: a computer program for converting electron diffraction patterns into X-ray diffraction patterns

Liu, Hongwei ; Foley, Matthew ; Lin, Qingyun ; Liu, Jiangwen

Journal of applied crystallography, 2016-04, Vol.49 (2), p.636-641 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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6
The Pixel Anomaly Detection Tool: a user‐friendly GUI for classifying detector frames using machine‐learning approaches
The Pixel Anomaly Detection Tool: a user‐friendly GUI for classifying detector frames using machine‐learning approaches
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The Pixel Anomaly Detection Tool: a user‐friendly GUI for classifying detector frames using machine‐learning approaches

Ketawala, Gihan ; Reiter, Caitlin M. ; Fromme, Petra ; Botha, Sabine

Journal of applied crystallography, 2024-04, Vol.57 (2), p.529-538 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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7
Classification of diffraction patterns using a convolutional neural network in single‐particle‐imaging experiments performed at X‐ray free‐electron lasers
Classification of diffraction patterns using a convolutional neural network in single‐particle‐imaging experiments performed at X‐ray free‐electron lasers
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Classification of diffraction patterns using a convolutional neural network in single‐particle‐imaging experiments performed at X‐ray free‐electron lasers

Assalauova, Dameli ; Ignatenko, Alexandr ; Isensee, Fabian ; Trofimova, Darya ; Vartanyants, Ivan A.

Journal of applied crystallography, 2022-06, Vol.55 (3), p.444-454 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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8
Digitization of imaging plates from Guinier powder X‐ray diffraction cameras
Digitization of imaging plates from Guinier powder X‐ray diffraction cameras
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Digitization of imaging plates from Guinier powder X‐ray diffraction cameras

Nasir, Jamal ; Steinbrück, Nils ; Xu, Ke ; Engelen, Bernward ; Schmedt auf der Günne, Jörn

Journal of applied crystallography, 2022-10, Vol.55 (5), p.1097-1103 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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9
A fast X‐ray‐diffraction‐based method for the determination of crystal size distributions (FXD‐CSD)
A fast X‐ray‐diffraction‐based method for the determination of crystal size distributions (FXD‐CSD)
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A fast X‐ray‐diffraction‐based method for the determination of crystal size distributions (FXD‐CSD)

Neher, Sigmund H. ; Klein, Helmut ; Kuhs, Werner F.

Journal of applied crystallography, 2018-10, Vol.51 (5), p.1352-1371 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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10
CADEM: calculate X‐ray diffraction of epitaxial multilayers
CADEM: calculate X‐ray diffraction of epitaxial multilayers
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CADEM: calculate X‐ray diffraction of epitaxial multilayers

Komar, Paulina ; Jakob, Gerhard

Journal of applied crystallography, 2017-02, Vol.50 (1), p.288-292 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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