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1 |
Material Type: Livro
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Interferogram analysis digital fringe pattern measurement techniquesDavid W Robinson; Graeme T ReidBristol Institute of Physics Philadelphia c1993Localização: IF - Instituto de Física (621.36 R659i )(Acessar) |
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Material Type: Livro
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Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and ApplicationsServin, Manuel ; Quiroga, J. Antonio ; Padilla, MoisesNewark: John Wiley & Sons, Incorporated 2014Texto completo disponível |
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Material Type: Artigo
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A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in TransmissionBrodu, Etienne ; Bouzy, EmmanuelMicroscopy and microanalysis, 2018-12, Vol.24 (6), p.634-646 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
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Material Type: Artigo
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Prediction of Lattice Volumes of Crystal Samples by Computer Image Recognition on the X-ray Diffraction PatternsMa, Dong ; Liu, Yuke ; Fan, Qingwen ; Li, Xinsheng ; Ma, Daichuan ; Luo, DaibingCrystals (Basel), 2022-11, Vol.12 (11), p.1676 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
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Material Type: Artigo
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A software tool for automatic analysis of selected area diffraction patterns within Digital MicrographWu, C.H. ; Reynolds, W.T. ; Murayama, M.Ultramicroscopy, 2012, Vol.112 (1), p.10-14 [Periódico revisado por pares]Netherlands: Elsevier B.VTexto completo disponível |
6 |
Material Type: Artigo
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Electron ptychography achieves atomic-resolution limits set by lattice vibrationsChen, Zhen ; Jiang, Yi ; Shao, Yu-Tsun ; Holtz, Megan E ; Odstrčil, Michal ; Guizar-Sicairos, Manuel ; Hanke, Isabelle ; Ganschow, Steffen ; Schlom, Darrell G ; Muller, David AScience (American Association for the Advancement of Science), 2021-05, Vol.372 (6544), p.826-831 [Periódico revisado por pares]United States: The American Association for the Advancement of ScienceTexto completo disponível |
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Material Type: Artigo
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Fast Radon transforms for high-precision EBSD orientation determination using PyEBSDIndexRowenhorst, David J. ; Callahan, Patrick G. ; Ånes, Håkon W.Journal of applied crystallography, 2024-02, Vol.57 (1), p.3-19 [Periódico revisado por pares]Oxford: Blackwell Publishing LtdTexto completo disponível |
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Material Type: Artigo
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Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 1. Where is the Bragg angle?Nolze, Gert ; Tokarski, Tomasz ; Rychłowski, ŁukaszJournal of applied crystallography, 2023-04, Vol.56 (2), p.349-360 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
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Material Type: Artigo
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Optically Inspired Nanomagnonics with Nonreciprocal Spin Waves in Synthetic AntiferromagnetsAlbisetti, Edoardo ; Tacchi, Silvia ; Silvani, Raffaele ; Scaramuzzi, Giuseppe ; Finizio, Simone ; Wintz, Sebastian ; Rinaldi, Christian ; Cantoni, Matteo ; Raabe, Jörg ; Carlotti, Giovanni ; Bertacco, Riccardo ; Riedo, Elisa ; Petti, DanielaAdvanced materials (Weinheim), 2020-03, Vol.32 (9), p.e1906439-n/a [Periódico revisado por pares]Germany: Wiley Subscription Services, IncTexto completo disponível |
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Material Type: Artigo
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Bragg Spot Finder (BSF): a new machine‐learning‐aided approach to deal with spot finding for rapidly filtering diffraction pattern imagesDong, Jianxiang ; Yin, Zhaozheng ; Kreitler, Dale ; Bernstein, Herbert J. ; Jakoncic, JeanJournal of applied crystallography, 2024-06, Vol.57 (3), p.670-680 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |