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Geometric Nonlinear Effect on Biaxial Bending Strength of Thin Silicon Die in the PoEF TestTsai, Ming-Yi ; Yeh, Jia-Hao ; Huang, Pu-Shan ; Chen, D. L. ; Shih, M. K. ; Tarng, DavidIEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.442-451 [Periódico revisado por pares]New York: IEEETexto completo disponível |