skip to main content
Idioma:
Refinado por: assunto: Microscopia remover assunto: Sensor remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior

Ricardo Nozaki Hélio Aparecido Navarro; Reyolando Manoel Lopes Rebello da Fonseca Brasil 1948-; Marcelo de Assumpção Pereira da Silva; Angelo Marcelo Tusset; Atila Madureira Bueno; José Manoel Balthazar; International Mechanical Engineering Congress and Exposition - IMECE (2014 Montreal, Quebec, Canada)

Proceedings of the ASME New York, NY : ASME, 2014

New York, NY ASME 2014

Item não circula. Consulte sua biblioteca.(Acessar)

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.