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Material Type: Artigo
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Diagonal Quadratic Approximation for Parallelization of Analytical Target CascadingLi, Yanjing ; Lu, Zhaosong ; Michalek, Jeremy JJournal of mechanical design (1990), 2008-05, Vol.130 (5), p.051402 (11)-051402 (11) [Periódico revisado por pares]New York, NY: ASMETexto completo disponível |
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Material Type: Artigo
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Solar cell parameter extraction using genetic algorithmsJervase, Joseph A ; Bourdoucen, Hadj ; Al-Lawati, AliMeasurement science & technology, 2001-11, Vol.12 (11), p.1922-1925 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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The theory of diffraction-limited resolution in microparticle image velocimetryMeinhart, Carl D ; Wereley, Steven TMeasurement science & technology, 2003-07, Vol.14 (7), p.1047-1053 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Characterization of micromechanical structures using white-light interferometryO’Mahony, Conor ; Hill, Martin ; Brunet, Magali ; Duane, Russell ; Mathewson, AlanMeasurement science & technology, 2003-10, Vol.14 (10), p.1807-1814 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Inverse solutions for electrical impedance tomography based on conjugate gradients methodsWang, MMeasurement science & technology, 2002-01, Vol.13 (1), p.101-117 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Dependence of inertial measurements of distance on accelerometer noiseThong, Y K ; Woolfson, M S ; Crowe, J A ; Hayes-Gill, B R ; Challis, R EMeasurement science & technology, 2002-08, Vol.13 (8), p.1163-1172, Article 301 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Non-destructive banana ripeness determination using a neural network-based electronic noseLlobet, Eduard ; Hines, Evor L ; Gardner, Julian W ; Franco, StefanoMeasurement science & technology, 1999-06, Vol.10 (6), p.538-548 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Velocity measurement of pneumatically conveyed solids using electrodynamic sensorsYan, Y ; Byrne, B ; Woodhead, S ; Coulthard, JMeasurement science & technology, 1995-05, Vol.6 (5), p.515-537 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Development of a high-precision straightness measuring system with DVD pick-up headFan, Kuang-Chao ; Chu, Chih-Liang ; Liao, Jarn-Lien ; Mou, Jong-IMeasurement science & technology, 2003-01, Vol.14 (1), p.47-54 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Surface plasmon resonance: instrumental resolution using photo diode arraysJohansen, Knut ; Stålberg, Ralph ; Lundström, Ingemar ; Liedberg, BoMeasurement science & technology, 2000-11, Vol.11 (11), p.1630-1638 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |