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301 - Symposium social health: a pathway to inclusion and cognitive healthVernooij-Dassen, Myrra ; Verspoor, Eline ; Hubers, Claudia ; Lenart, Marta ; Wiegelman, Henrik ; Perry, MariekeInternational psychogeriatrics, 2021-10, Vol.33 (S1), p.20-23 [Periódico revisado por pares]Cambridge, UK: Cambridge University PressTexto completo disponível |
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304 - Mental healthcare services and advocacy for older people amidst the COVID crisis: Voices from South AsiaInternational psychogeriatrics, 2021-10, Vol.33 (S1), p.27-27 [Periódico revisado por pares]Cambridge, UK: Cambridge University PressTexto completo disponível |
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SymposiaMicroscopy and microanalysis, 2013-08, Vol.19 (S3), p.15-22 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
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New Product Announcement – LEAP 6000XR, New Applications, New PerformanceUlfig, Robert ; Lenz, Daniel ; Groth, Gard ; Bunton, Joseph H. ; Martin, Isabel ; Prosa, Ty J. ; Reinhard, David A. ; Clifton, Peter H. ; Geiser, Brian P. ; Larson, David J.Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.3190-3191 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
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New Product Announcement – Invizo 6000, New Applications, New PerformanceReinhard, David A. ; Lenz, Daniel ; Martin, Isabelle ; Prosa, Ty J. ; Ulfig, Robert M. ; Clifton, Peter H. ; Geiser, Brian P. ; Bunton, Joseph H. ; Larson, David J.Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.3188-3189 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
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Diffuse Scattering from a RAFA Lens Produced High-Intensity, Far-Focused, Small 3D Virtual SourceHerring, Rodney A.Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.3180-3181 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
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The Performance of Detectors for Diffraction-Based Studies in (S)TEMPakzad, Anahita ; Reis, Roberto dosMicroscopy and microanalysis, 2022-08, Vol.28 (S1), p.3192-3193 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
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Advanced In Situ TEM Nanomechanical Testing Options with the PI-95Bhowmick, Sanjit ; Hintsala, Eric ; Stauffer, DouglasMicroscopy and microanalysis, 2022-08, Vol.28 (S1), p.3174-3175 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
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Spectra optimizes the use of electron doseVan Cappellen, Eric ; Maunders, Christian ; Kieft, Ingrid ; Bischoff, Maarten ; Van Uden, Felix ; Ovsyanko, Mikhail ; Markus, Boy ; Krijnen, Ruud ; Ozsoy-Keskinbora, Cigdem ; Freitag, Bert ; Smit, Casper ; Altin, Veli ; Geurink, RudolfMicroscopy and microanalysis, 2021-08, Vol.27 (S1), p.1066-1067 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
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Plasma cleaning reliability over pressure and power rangesMoore, CameronMicroscopy and microanalysis, 2021-08, Vol.27 (S1), p.1650-1651 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |