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1
Octahedral conversion of a-SiO2 host matrix by pulsed ion implantation
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Octahedral conversion of a-SiO2 host matrix by pulsed ion implantation

Zatsepin, D. A. ; Zatsepin, A. F. ; Boukhvalov, D. W. ; Kurmaev, E. Z. ; Gavrilov, N. V. ; Skorikov, N. A. ; von Czarnowski, A. ; Fitting, H.-J.

physica status solidi (b), 2015-10, Vol.252 (10), p.2185-2190 [Peer Reviewed Journal]

Blackwell Publishing Ltd

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2
Time-dependent start-up and decay of secondary electron emission in dielectrics
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Article
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Time-dependent start-up and decay of secondary electron emission in dielectrics

Fitting, H.-J. ; Touzin, M.

Journal of applied physics, 2010-08, Vol.108 (3) [Peer Reviewed Journal]

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3
Secondary electron emission and self-consistent charge transport in semi-insulating samples
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Secondary electron emission and self-consistent charge transport in semi-insulating samples

Fitting, H.-J. ; Touzin, M.

Journal of applied physics, 2011-08, Vol.110 (4), p.044111-044111-10 [Peer Reviewed Journal]

United States: American Institute of Physics

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4
Electron beam charging of insulators: A self-consistent flight-drift model
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Electron beam charging of insulators: A self-consistent flight-drift model

Touzin, M. ; Goeuriot, D. ; Guerret-Piécourt, C. ; Juvé, D. ; Tréheux, D. ; Fitting, H.-J.

Journal of applied physics, 2006-06, Vol.99 (11), p.114110-114110-14 [Peer Reviewed Journal]

United States: American Institute of Physics

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5
XPS analysis and valence band structure of a low-dimensional SiO2/Si system after Si+ ion implantation
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XPS analysis and valence band structure of a low-dimensional SiO2/Si system after Si+ ion implantation

Zatsepin, D. A. ; Mack, P. ; Wright, A. E. ; Schmidt, B. ; Fitting, H.-J.

Physica status solidi. A, Applications and materials science, 2011-07, Vol.208 (7), p.1658-1661 [Peer Reviewed Journal]

Berlin: WILEY-VCH Verlag

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6
Electron beam charging of insulators with surface layer and leakage currents
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Electron beam charging of insulators with surface layer and leakage currents

Cornet, N. ; Goeuriot, D. ; Guerret-Piécourt, C. ; Juvé, D. ; Tréheux, D. ; Touzin, M. ; Fitting, H.-J.

Journal of applied physics, 2008-03, Vol.103 (6), p.064110-064110-13 [Peer Reviewed Journal]

American Institute of Physics

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7
Electron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathodoluminescence
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Electron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathodoluminescence

Fitting, H.-J. ; Fitting Kourkoutis, L. ; Schmidt, B. ; Liedke, B. ; Ivanova, E. V. ; Zamoryanskaya, M. V. ; Pustovarov, V. A. ; Zatsepin, A. F.

Physica status solidi. A, Applications and materials science, 2012-06, Vol.209 (6), p.1101-1108 [Peer Reviewed Journal]

Berlin: WILEY-VCH Verlag

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8
Silicon nanocluster aggregation in SiO2:Si layers
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Silicon nanocluster aggregation in SiO2:Si layers

Fitting, H.-J. ; Kourkoutis, L. Fitting ; Salh, Roushdey ; Zamoryanskaya, M. V. ; Schmidt, B.

Physica status solidi. A, Applications and materials science, 2010-01, Vol.207 (1), p.117-123 [Peer Reviewed Journal]

Berlin: WILEY-VCH Verlag

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9
Luminescent properties of GaN films grown on porous silicon substrate
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Luminescent properties of GaN films grown on porous silicon substrate

Matoussi, A. ; Ben Nasr, F. ; Boufaden, T. ; Salh, R. ; Fakhfakh, Z. ; Guermazi, S. ; ElJani, B. ; Fitting, H.-J.

Journal of luminescence, 2010-03, Vol.130 (3), p.399-403 [Peer Reviewed Journal]

Amsterdam: Elsevier B.V

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10
Cathodoluminescence of non-stoichiometric silica: The role of oxygen
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Cathodoluminescence of non-stoichiometric silica: The role of oxygen

Salh, Roushdey ; von Czarnowski, A. ; Fitting, H.-J.

Journal of non-crystalline solids, 2007-04, Vol.353 (5), p.546-549 [Peer Reviewed Journal]

Amsterdam: Elsevier B.V

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