Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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11 |
Material Type: Artigo
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The MiniSDD-Based 1-Mpixel Camera of the DSSC Project for the European XFELPorro, Matteo ; Andricek, Ladislav ; Aschauer, Stefan ; Castoldi, Andrea ; Donato, Mattia ; Engelke, Jan ; Erdinger, Florian ; Fiorini, Carlo ; Fischer, Peter ; Graafsma, Heinz ; Grande, Andrea ; Guazzoni, Chiara ; Hansen, Karsten ; Hauf, Steffen ; Kalavakuru, Pradeep ; Klaer, Helmut ; Tangl, Manfred ; Kugel, Andreas ; Kuster, Markus ; Lechner, Peter ; Lomidze, David ; Maffessanti, Stefano ; Manghisoni, Massimo ; Nidhi, Sneha ; Okrent, Frank ; Re, Valerio ; Reckleben, Christian ; Riceputi, Elisa ; Richter, Rainer ; Samartsev, Andrey ; Schlee, Stephan ; Soldat, Jan ; Struder, Lothar ; Szymanski, Janusz ; Turcato, Monica ; Weidenspointner, Georg ; Wunderer, Cornelia B.IEEE transactions on nuclear science, 2021-06, Vol.68 (6), p.1334-1350 [Periódico revisado por pares]New York: IEEETexto completo disponível |
12 |
Material Type: Artigo
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Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate TransistorsSeifert, Norbert ; Jahinuzzaman, Shah ; Velamala, Jyothi ; Ascazubi, Ricardo ; Patel, Nikunj ; Gill, Balkaran ; Basile, Joseph ; Hicks, JeffreyIEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2570-2577 [Periódico revisado por pares]New York: IEEETexto completo disponível |
13 |
Material Type: Artigo
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Automated Isotope Identification Algorithm Using Artificial Neural NetworksKamuda, M. ; Stinnett, J. ; Sullivan, C. J.IEEE transactions on nuclear science, 2017-07, Vol.64 (7), p.1858-1864 [Periódico revisado por pares]New York: IEEETexto completo disponível |
14 |
Material Type: Artigo
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A Global Analysis of Light and Charge Yields in Liquid XenonLenardo, Brian ; Kazkaz, Kareem ; Manalaysay, Aaron ; Mock, Jeremy ; Szydagis, Matthew ; Tripathi, ManiIEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.3387-3396 [Periódico revisado por pares]New York: IEEETexto completo disponível |
15 |
Material Type: Artigo
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Electron, Neutron, and Proton Irradiation Effects on SiC Radiation DetectorsRafi, Joan Marc ; Pellegrini, Giulio ; Godignon, Philippe ; Ugobono, Sofia Otero ; Rius, Gemma ; Tsunoda, Isao ; Yoneoka, Masashi ; Takakura, Kenichiro ; Kramberger, Gregor ; Moll, MichaelIEEE transactions on nuclear science, 2020-12, Vol.67 (12), p.2481-2489 [Periódico revisado por pares]New York: IEEETexto completo disponível |
16 |
Material Type: Artigo
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Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate PredictionBlack, J. D. ; Dodd, P. E. ; Warren, K. M.IEEE transactions on nuclear science, 2013-06, Vol.60 (3), p.1836-1851 [Periódico revisado por pares]IEEETexto completo disponível |
17 |
Material Type: Artigo
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The Stereoscopic Analog Trigger of the MAGIC TelescopesDazzi, F. ; Schweizer, T. ; Ceribella, G. ; Corti, D. ; Dettlaff, A. ; Garcia, J. R. ; Hafner, D. ; Herranz, D. ; Lopez-Moya, M. ; Mariotti, M. ; Maier, R. ; Metz, S. ; Mirzoyan, R. ; Nakajima, D. ; Saito, T. ; Shayduk, M. ; Sitarek, J. ; Strom, D. ; Teshima, M. ; Tran, S. ; Will, M.IEEE transactions on nuclear science, 2021-07, Vol.68 (7), p.1473-1486 [Periódico revisado por pares]New York: IEEETexto completo disponível |
18 |
Material Type: Artigo
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Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator TransistorsSimoen, E. ; Gaillardin, M. ; Paillet, P. ; Reed, R. A. ; Schrimpf, R. D. ; Alles, M. L. ; El-Mamouni, F. ; Fleetwood, D. M. ; Griffoni, A. ; Claeys, C.IEEE transactions on nuclear science, 2013-06, Vol.60 (3), p.1970-1991 [Periódico revisado por pares]IEEETexto completo disponível |
19 |
Material Type: Artigo
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A Hybrid Approach to FPGA Configuration ScrubbingStoddard, Aaron ; Gruwell, Ammon ; Zabriskie, Peter ; Wirthlin, Michael J.IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.497-503 [Periódico revisado por pares]New York: IEEETexto completo disponível |
20 |
Material Type: Artigo
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Simulation of Single Particle Displacement Damage in Silicon-Part II: Generation and Long-Time Relaxation of Damage StructureJay, Antoine ; Raine, Melanie ; Richard, Nicolas ; Mousseau, Normand ; Goiffon, Vincent ; Hemeryck, Anne ; Magnan, PierreIEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.141-148 [Periódico revisado por pares]New York: IEEETexto completo disponível |