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Material Type: Artigo
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The Use of High Energy X-Ray Generators for TID Testing of Electronic DevicesGirones, Vincent ; Boch, Jerome ; Carapelle, Alain ; Chapon, Arnaud ; Maraine, Tadec ; Labau, Timothee ; Saigne, Frederic ; Alia, Ruben GarciaIEEE transactions on nuclear science, 2023-01, Vol.70 (8), p.1-1 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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A Simple Low-Dose X-Ray CT Simulation From High-Dose ScanZeng, Dong ; Huang, Jing ; Bian, Zhaoying ; Niu, Shanzhou ; Zhang, Hua ; Feng, Qianjin ; Liang, Zhengrong ; Ma, JianhuaIEEE transactions on nuclear science, 2015-10, Vol.62 (5), p.2226-2233 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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Material Type: Artigo
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A 3.9-ps RMS Precision Time-to-Digital Converter Using Ones-Counter Encoding Scheme in a Kintex-7 FPGAWang, Yonggang ; Kuang, Jie ; Liu, Chong ; Cao, QiangIEEE transactions on nuclear science, 2017-10, Vol.64 (10), p.2713-2718 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Neural Networks for Modeling and Control of Particle AcceleratorsEdelen, A. L. ; Biedron, S. G. ; Chase, B. E. ; Edstrom, D. ; Milton, S. V. ; Stabile, P.IEEE transactions on nuclear science, 2016-04, Vol.63 (2), p.878-897 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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CHARM: A Mixed Field Facility at CERN for Radiation Tests in Ground, Atmospheric, Space and Accelerator Representative EnvironmentsMekki, J. ; Brugger, M. ; Alia, R. G. ; Thornton, A. ; Dos Santos Mota, N. C. ; Danzeca, S.IEEE transactions on nuclear science, 2016-08, Vol.63 (4), p.2106-2114 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric EnvironmentsCecchetto, Matteo ; Alia, Ruben Garcia ; Wrobel, Frederic ; Coronetti, Andrea ; Bilko, Kacper ; Lucsanyi, David ; Fiore, Salvatore ; Bazzano, Giulia ; Pirovano, Elisa ; Nolte, RalfIEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.873-883 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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The MiniSDD-Based 1-Mpixel Camera of the DSSC Project for the European XFELPorro, Matteo ; Andricek, Ladislav ; Aschauer, Stefan ; Castoldi, Andrea ; Donato, Mattia ; Engelke, Jan ; Erdinger, Florian ; Fiorini, Carlo ; Fischer, Peter ; Graafsma, Heinz ; Grande, Andrea ; Guazzoni, Chiara ; Hansen, Karsten ; Hauf, Steffen ; Kalavakuru, Pradeep ; Klaer, Helmut ; Tangl, Manfred ; Kugel, Andreas ; Kuster, Markus ; Lechner, Peter ; Lomidze, David ; Maffessanti, Stefano ; Manghisoni, Massimo ; Nidhi, Sneha ; Okrent, Frank ; Re, Valerio ; Reckleben, Christian ; Riceputi, Elisa ; Richter, Rainer ; Samartsev, Andrey ; Schlee, Stephan ; Soldat, Jan ; Struder, Lothar ; Szymanski, Janusz ; Turcato, Monica ; Weidenspointner, Georg ; Wunderer, Cornelia B.IEEE transactions on nuclear science, 2021-06, Vol.68 (6), p.1334-1350 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate TransistorsSeifert, Norbert ; Jahinuzzaman, Shah ; Velamala, Jyothi ; Ascazubi, Ricardo ; Patel, Nikunj ; Gill, Balkaran ; Basile, Joseph ; Hicks, JeffreyIEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2570-2577 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Automated Isotope Identification Algorithm Using Artificial Neural NetworksKamuda, M. ; Stinnett, J. ; Sullivan, C. J.IEEE transactions on nuclear science, 2017-07, Vol.64 (7), p.1858-1864 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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A Global Analysis of Light and Charge Yields in Liquid XenonLenardo, Brian ; Kazkaz, Kareem ; Manalaysay, Aaron ; Mock, Jeremy ; Szydagis, Matthew ; Tripathi, ManiIEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.3387-3396 [Periódico revisado por pares]New York: IEEETexto completo disponível |