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Relationships among Trapped Hole and Trapped Electron Centers in Oxidized Soda–Silica Glasses of High Purity
Relationships among Trapped Hole and Trapped Electron Centers in Oxidized Soda–Silica Glasses of High Purity
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Relationships among Trapped Hole and Trapped Electron Centers in Oxidized Soda–Silica Glasses of High Purity

Cohen, A. J. ; Janezic, G. G.

Physica status solidi. A, Applied research, 1983-06, Vol.77 (2), p.619-624

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Models for Color Centers in Smoky Quartz
Models for Color Centers in Smoky Quartz
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Models for Color Centers in Smoky Quartz

Cohen, A. J. ; Makar, L. N.

Physica status solidi. A, Applied research, 1982-10, Vol.73 (2), p.593-596

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Hydrogen Incorporation in Sputter-Deposited, In-Chamber Annealed Amorphous Silicon Thin Films. An Infrared and Elastic Recoil Analysis
Hydrogen Incorporation in Sputter-Deposited, In-Chamber Annealed Amorphous Silicon Thin Films. An Infrared and Elastic Recoil Analysis
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Hydrogen Incorporation in Sputter-Deposited, In-Chamber Annealed Amorphous Silicon Thin Films. An Infrared and Elastic Recoil Analysis

Rüther, R. ; Livingstone, J. ; Dytlewski, N. ; Cohen, D.

Physica status solidi. A, Applied research, 1994-09, Vol.145 (1), p.K37-K42 [Periódico revisado por pares]

Berlin: WILEY-VCH Verlag

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Investigation of the ferroelectric solid solution PbScx/2Fe(1−x)/2Nb0.5O3
Investigation of the ferroelectric solid solution PbScx/2Fe(1−x)/2Nb0.5O3
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Investigation of the ferroelectric solid solution PbScx/2Fe(1−x)/2Nb0.5O3

Ferriol, M. ; Rivolier, J.-L. ; Cohen-Adad, M.-Th

Physica status solidi. A, Applied research, 1995-12, Vol.152 (2), p.541-548

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Hydrogen Incorporation in Sputter-Deposited, In-Chamber Annealed Amorphous Silicon Thin Films. An Infrared and Elastic Recoil Analysis
Hydrogen Incorporation in Sputter-Deposited, In-Chamber Annealed Amorphous Silicon Thin Films. An Infrared and Elastic Recoil Analysis
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Hydrogen Incorporation in Sputter-Deposited, In-Chamber Annealed Amorphous Silicon Thin Films. An Infrared and Elastic Recoil Analysis

Rüther, R. ; Livingstone, J. ; Dytlewski, N. ; Cohen, D.

Physica status solidi. A, Applied research, 1994-10, Vol.145 (2), p.K37-K42

Berlin: WILEY-VCH Verlag

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Variation of theQ-factor of thin crystalline and dendritic metallic layers as a function of frequency and determination of the fractal dimension of the dendritic material
Variation of theQ-factor of thin crystalline and dendritic metallic layers as a function of frequency and determination of the fractal dimension of the dendritic material
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Variation of theQ-factor of thin crystalline and dendritic metallic layers as a function of frequency and determination of the fractal dimension of the dendritic material

Allam, L. ; Cohen, B. ; Ablart, G. ; Pescia, J.

Physica status solidi. A, Applied research, 1993-07, Vol.138 (1), p.185-189

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