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Material Type: Artigo
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Special Section Introduction—Online Community as Space for Knowledge FlowsFaraj, Samer ; von Krogh, Georg ; Monteiro, Eric ; Lakhani, Karim R.Information systems research, 2016-12, Vol.27 (4), p.668-684 [Periódico revisado por pares]INFORMSTexto completo disponível |
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Material Type: Ata de Congresso
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FaCoY - A Code-to-Code Search EngineKim, Kisub ; Kim, Dongsun ; Bissyande, Tegawende F. ; Choi, Eunjong ; Li, Li ; Klein, Jacques ; Le Traon, Yves2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018, p.946-957ACMTexto completo disponível |
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Material Type: Artigo
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Online community as space for knowledge flowsFaraj, Samer ; von Krogh, Georg ; Monteiro, Eric ; Lakhani, Karim RInformation systems research, 2016-12, Vol.27 (4), p.668 [Periódico revisado por pares]Institute for Operations Research and the Management SciencesTexto completo disponível |
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Material Type: Ata de Congresso
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CURE: Code-Aware Neural Machine Translation for Automatic Program RepairJiang, Nan ; Lutellier, Thibaud ; Tan, Lin2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1161-1173IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Bugs.jar: A Large-Scale, Diverse Dataset of Real-World Java BugsSaha, Ripon ; Lyu, Yingjun ; Lam, Wing ; Yoshida, Hiroaki ; Prasad, Mukul2018 IEEE/ACM 15th International Conference on Mining Software Repositories (MSR), 2018, p.10-13ACMTexto completo disponível |
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Material Type: Ata de Congresso
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Fault Localization with Code Coverage Representation LearningLi, Yi ; Wang, Shaohua ; Nguyen, Tien2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.661-673IEEETexto completo disponível |
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Material Type: Ata de Congresso
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A Graph Solver for the Automated Generation of Consistent Domain-Specific ModelsSemerath, Oszkar ; Nagy, Andras Szabolcs ; Varro, Daniel2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018, p.969-980ACMTexto completo disponível |
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Material Type: Ata de Congresso
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Prioritizing Test Inputs for Deep Neural Networks via Mutation AnalysisWang, Zan ; You, Hanmo ; Chen, Junjie ; Zhang, Yingyi ; Dong, Xuyuan ; Zhang, Wenbin2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.397-409IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Identifying Patch Correctness in Test-Based Program RepairXiong, Yingfei ; Liu, Xinyuan ; Zeng, Muhan ; Zhang, Lu ; Huang, Gang2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018, p.789-799ACMTexto completo disponível |
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Material Type: Ata de Congresso
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DeepLocalize: Fault Localization for Deep Neural NetworksWardat, Mohammad ; Le, Wei ; Rajan, Hridesh2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.251-262IEEETexto completo disponível |