Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Physics 50 years later [Papers] as presented to the XIV General Assembly of the International Union of Pure and Applied Physics on the occasion of the union's fiftieth anniversary, September 1972Sanborn Conner Brown 1913-; International Union of Pure and Applied PhysicsWashington National Academy of Sciences 1973Localização: IF - Instituto de Física (530.08 B879p )(Acessar) |
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2 |
Material Type: Livro
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Applied mathematics for engineers and physicistsLouis Albert Pipes 1910- Lawrence R Harvill 1935-New York McGraw-Hill 1970Localização: EPBC - Esc. Politécnica-Bib Central (530.19 P661a3 ) e outros locais(Acessar) |
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3 |
Material Type: Livro
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Picture Processing and Digital FilteringHuang, T. S ; Andrews, H. C ; Billingsley, F. C ; Fiasconaro, J. G ; Frieden, B. R ; Read, R. R ; Shanks, J. L ; Treitel, S Huang, Thomas S.Berlin, Heidelberg: Springer Berlin / Heidelberg 1979Texto completo disponível |
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4 |
Material Type: Livro
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Magnetoelastic InteractionsTruesdell, C ; Aris, R ; Collatz, LBerlin, Heidelberg: Springer Berlin / Heidelberg 1966Texto completo disponível |
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5 |
Material Type: Livro
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Robert Hooke's Contributions to Mechanics: A Study in Seventeenth Century Natural PhilosophyCentore, F. FDordrecht: Springer Netherlands 1970Texto completo disponível |
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6 |
Material Type: Livro
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The Quantum Principle: Its Interpretation and EpistemologyMehra, JagdishDordrecht: Springer Netherlands 1974Texto completo disponível |
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7 |
Material Type: Artigo
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The electrical properties of polycrystalline silicon filmsSeto, John Y. W.Journal of applied physics, , Vol.46 (12), p.5247-5254 [Periódico revisado por pares]Texto completo disponível |
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8 |
Material Type: Livro
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Electronics: A General Introduction for the Non-SpecialistOlsen, George HenryBoston, MA: Springer 1968Texto completo disponível |
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9 |
Material Type: Livro
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Localized Excitations in SolidsWallis, R. F Wallis, R. F.Boston, MA: Springer 1968Texto completo disponível |
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10 |
Material Type: Artigo
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Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsLang, D. V.Journal of applied physics, 1974-07, Vol.45 (7), p.3023-3032 [Periódico revisado por pares]Texto completo disponível |