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1 |
Material Type: Artigo
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BX90: a new diamond anvil cell design for X-ray diffraction and optical measurementsKantor, I ; Prakapenka, V ; Kantor, A ; Dera, P ; Kurnosov, A ; Sinogeikin, S ; Dubrovinskaia, N ; Dubrovinsky, LReview of scientific instruments, 2012-12, Vol.83 (12), p.125102-125102 [Periódico revisado por pares]United StatesTexto completo disponível |
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Material Type: Artigo
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Development of a compact fast CCD camera and resonant soft x-ray scattering endstation for time-resolved pump-probe experimentsDoering, D. ; Chuang, Y.-D. ; Andresen, N. ; Chow, K. ; Contarato, D. ; Cummings, C. ; Domning, E. ; Joseph, J. ; Pepper, J. S. ; Smith, B. ; Zizka, G. ; Ford, C. ; Lee, W. S. ; Weaver, M. ; Patthey, L. ; Weizeorick, J. ; Hussain, Z. ; Denes, P.Review of scientific instruments, 2011-07, Vol.82 (7), p.073303-073303-8 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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High-temperature experiments using a resistively heated high-pressure membrane diamond anvil cellJenei, Zsolt ; Cynn, Hyunchae ; Visbeck, Ken ; Evans, William JReview of scientific instruments, 2013-09, Vol.84 (9), p.095114-095114 [Periódico revisado por pares]United StatesTexto completo disponível |
4 |
Material Type: Artigo
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Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facilityGupta, Y M ; Turneaure, Stefan J ; Perkins, K ; Zimmerman, K ; Arganbright, N ; Shen, G ; Chow, PReview of scientific instruments, 2012-12, Vol.83 (12), p.123905-123905 [Periódico revisado por pares]United StatesTexto completo disponível |
5 |
Material Type: Artigo
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A versatile medium-resolution x-ray emission spectrometer for diamond anvil cell applicationsMortensen, D R ; Seidler, G T ; Bradley, J A ; Lipp, M J ; Evans, W J ; Chow, P ; Xiao, Y-M ; Boman, G ; Bowden, M EReview of scientific instruments, 2013-08, Vol.84 (8), p.083908-083908 [Periódico revisado por pares]United StatesTexto completo disponível |
6 |
Material Type: Artigo
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An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV rangeVine, D. J. ; Williams, G. J. ; Clark, J. N. ; Putkunz, C. T. ; Pfeifer, M. A. ; Legnini, D. ; Roehrig, C. ; Wrobel, E. ; Huwald, E. ; van Riessen, G. ; Abbey, B. ; Beetz, T. ; Irwin, J. ; Feser, M. ; Hornberger, B. ; McNulty, I. ; Nugent, K. A. ; Peele, A. G.Review of scientific instruments, 2012-03, Vol.83 (3), p.033703-033703-5 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
7 |
Material Type: Artigo
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Design and implementation of an integral wall-mounted quartz crystal microbalance for atomic layer depositionRiha, Shannon C ; Libera, Joseph A ; Elam, Jeffrey W ; Martinson, Alex B FReview of scientific instruments, 2012-09, Vol.83 (9), p.094101-094101 [Periódico revisado por pares]United StatesTexto completo disponível |
8 |
Material Type: Artigo
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A wavelet transform algorithm for peak detection and application to powder x-ray diffraction dataGregoire, John M. ; Dale, Darren ; van Dover, R. BruceReview of scientific instruments, 2011-01, Vol.82 (1), p.015105-015105-8 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
9 |
Material Type: Artigo
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High resolution resistive thermometry for micro/nanoscale measurementsSadat, S. ; Meyhofer, E. ; Reddy, P.Review of scientific instruments, 2012-08, Vol.83 (8), p.084902-084902 [Periódico revisado por pares]United StatesTexto completo disponível |
10 |
Material Type: Artigo
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Flash heating in the diamond cell: melting curve of rheniumYang, Liuxiang ; Karandikar, Amol ; Boehler, ReinhardReview of scientific instruments, 2012-06, Vol.83 (6), p.063905-063905 [Periódico revisado por pares]United StatesTexto completo disponível |