Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Forward modeling of pile-up events in liquid scintillator detectors for neutron emission spectroscopySahlberg, A. ; Eriksson, J. ; Conroy, S. ; Ericsson, G. ; Hägg, L. ; Giacomelli, L. ; Belli, F.Review of scientific instruments, 2021-08, Vol.92 (8), p.083502-083502 [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
2 |
Material Type: Artigo
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Velocity-space sensitivity of the time-of-flight neutron spectrometer at JETJacobsen, A S ; Salewski, M ; Eriksson, J ; Ericsson, G ; Hjalmarsson, A ; Korsholm, S B ; Leipold, F ; Nielsen, S K ; Rasmussen, J ; Stejner, MReview of scientific instruments, 2014-11, Vol.85 (11), p.11E103-11E103 [Periódico revisado por pares]United StatesTexto completo disponível |
3 |
Material Type: Artigo
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Invited Review Article: Single-photon sources and detectorsEisaman, M. D. ; Fan, J. ; Migdall, A. ; Polyakov, S. V.Review of scientific instruments, 2011-07, Vol.82 (7), p.071101-071101-25 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
4 |
Material Type: Artigo
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Single-photon sources: Approaching the ideal through multiplexingMeyer-Scott, Evan ; Silberhorn, Christine ; Migdall, AlanReview of Scientific Instruments, 2020-04, Vol.91 (4), p.041101-041101 [Periódico revisado por pares]United StatesTexto completo disponível |
5 |
Material Type: Artigo
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A suite-level review of the neutron powder diffraction instruments at Oak Ridge National LaboratoryCalder, S. ; An, K. ; Boehler, R. ; Dela Cruz, C. R. ; Frontzek, M. D. ; Guthrie, M. ; Haberl, B. ; Huq, A. ; Kimber, S. A. J. ; Liu, J. ; Molaison, J. J. ; Neuefeind, J. ; Page, K. ; dos Santos, A. M. ; Taddei, K. M. ; Tulk, C. ; Tucker, M. G.Review of scientific instruments, 2018-09, Vol.89 (9), p.092701-092701 [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
6 |
Material Type: Artigo
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A steady-state thermoreflectance method to measure thermal conductivityBraun, Jeffrey L. ; Olson, David H. ; Gaskins, John T. ; Hopkins, Patrick E.Review of scientific instruments, 2019-02, Vol.90 (2), p.024905-024905 [Periódico revisado por pares]United StatesTexto completo disponível |
7 |
Material Type: Artigo
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Record indoor magnetic field of 1200 T generated by electromagnetic flux-compressionNakamura, D. ; Ikeda, A. ; Sawabe, H. ; Matsuda, Y. H. ; Takeyama, S.Review of scientific instruments, 2018-09, Vol.89 (9), p.095106-095106 [Periódico revisado por pares]United StatesTexto completo disponível |
8 |
Material Type: Artigo
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The upgraded Large Plasma Device, a machine for studying frontier basic plasma physicsGekelman, W. ; Pribyl, P. ; Lucky, Z. ; Drandell, M. ; Leneman, D. ; Maggs, J. ; Vincena, S. ; Van Compernolle, B. ; Tripathi, S. K. P. ; Morales, G. ; Carter, T. A. ; Wang, Y. ; DeHaas, T.Review of scientific instruments, 2016-02, Vol.87 (2), p.025105-025105 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
9 |
Material Type: Artigo
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An instrument for in situ time-resolved X-ray imaging and diffraction of laser powder bed fusion additive manufacturing processesCalta, Nicholas P. ; Wang, Jenny ; Kiss, Andrew M. ; Martin, Aiden A. ; Depond, Philip J. ; Guss, Gabriel M. ; Thampy, Vivek ; Fong, Anthony Y. ; Weker, Johanna Nelson ; Stone, Kevin H. ; Tassone, Christopher J. ; Kramer, Matthew J. ; Toney, Michael F. ; Van Buuren, Anthony ; Matthews, Manyalibo J.Review of scientific instruments, 2018-05, Vol.89 (5), p.055101-055101 [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
10 |
Material Type: Artigo
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Calibration and energy measurement of optically levitated nanoparticle sensorsHebestreit, Erik ; Frimmer, Martin ; Reimann, René ; Dellago, Christoph ; Ricci, Francesco ; Novotny, LukasReview of scientific instruments, 2018-03, Vol.89 (3), p.033111-033111 [Periódico revisado por pares]United StatesTexto completo disponível |