Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Assemblies of Titanium Dioxide-Polystyrene Hybrid Nanoparticles for Dielectric ApplicationsTchoul, Maxim N ; Fillery, Scott P ; Koerner, Hilmar ; Drummy, Lawrence F ; Oyerokun, Folusho T ; Mirau, Peter A ; Durstock, Michael F ; Vaia, Richard AChemistry of materials, 2010-03, Vol.22 (5), p.1749-1759 [Periódico revisado por pares]American Chemical SocietyTexto completo disponível |
2 |
Material Type: Artigo
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Simultaneous immersion Mirau interferometryLyulko, Oleksandra V ; Randers-Pehrson, Gerhard ; Brenner, David JReview of scientific instruments, 2013-05, Vol.84 (5), p.053701-053701 [Periódico revisado por pares]United States: AIP Publishing LLCTexto completo disponível |
3 |
Material Type: Artigo
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Micromachined array-type Mirau interferometer for parallel inspection of MEMSAlbero, J ; Bargiel, S ; Passilly, N ; Dannberg, P ; Stumpf, M ; Zeitner, U D ; Rousselot, C ; Gastinger, K ; Gorecki, CJournal of micromechanics and microengineering, 2011-06, Vol.21 (6), p.065005 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
4 |
Material Type: Artigo
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Mirau interferometry of fluid interfaces deformed by colloids under the influence of external fieldsTrevenen, S. ; Beltramo, P. J.Review of scientific instruments, 2022-07, Vol.93 (7), p.073701-073701 [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
5 |
Material Type: Artigo
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Mirau-Based CSI with Oscillating Reference Mirror for Vibration Compensation in In-Process ApplicationsSerbes, Hüseyin ; Gollor, Pascal ; Hagemeier, Sebastian ; Lehmann, PeterApplied sciences, 2021-10, Vol.11 (20), p.9642 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
6 |
Material Type: Artigo
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Thin-film thickness profile measurement using a Mirau-type low-coherence interferometerGhim, Young-Sik ; Rhee, Hyug-Gyo ; Yang, Ho-Soon ; Lee, Yun-WooMeasurement science & technology, 2013-07, Vol.24 (7), p.75002 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
7 |
Material Type: Artigo
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An electrostatic vertical microscanner for phase modulating array-type Mirau microinterferometryLullin, Justine ; Bargiel, Sylwester ; Lemoal, Patrice ; Perrin, Stéphane ; Albero, Jorge ; Passilly, Nicolas ; Froehly, Luc ; Lardet-Vieudrin, Franck ; Gorecki, ChristopheJournal of micromechanics and microengineering, 2015-11, Vol.25 (11), p.115013-12 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
8 |
Material Type: Artigo
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Mechanism for Liquid Phase Exfoliation of MoS2Jawaid, Ali ; Nepal, Dhriti ; Park, Kyoungweon ; Jespersen, Michael ; Qualley, Anthony ; Mirau, Peter ; Drummy, Lawrence F ; Vaia, Richard AChemistry of materials, 2016-01, Vol.28 (1), p.337-348 [Periódico revisado por pares]American Chemical SocietyTexto completo disponível |
9 |
Material Type: Artigo
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A method for measuring the geometrical topography of a Rockwell diamond indenterChen, Yen-Liang ; Su, Der-ChinMeasurement science & technology, 2010-01, Vol.21 (1), p.015307-015307 (7) [Periódico revisado por pares]IOP PublishingTexto completo disponível |
10 |
Material Type: Artigo
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Keratin-based antimicrobial textiles, films, and nanofibersDickerson, Matthew B ; Sierra, Alexandra A ; Bedford, Nicholas M ; Lyon, Wanda J ; Gruner, William E ; Mirau, Peter A ; Naik, Rajesh RJournal of materials chemistry. B, Materials for biology and medicine, 2013-10, Vol.1 (40), p.5505-5514 [Periódico revisado por pares]EnglandTexto completo disponível |