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Effect of Layer-by-Layer Electrostatic Assemblies on the Surface Potential and Current Voltage Characteristic of Metal−Insulator−Semiconductor StructuresGorin, D. A ; Yashchenok, A. M ; Manturov, A. O ; Kolesnikova, T. A ; Möhwald, HLangmuir, 2009-11, Vol.25 (21), p.12529-12534 [Periódico revisado por pares]Washington, DC: American Chemical SocietyTexto completo disponível |