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Atomistic simulation of a III-V p-i-n junction: Comparison of density functional and tight-binding approaches
Atomistic simulation of a III-V p-i-n junction: Comparison of density functional and tight-binding approaches
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Atomistic simulation of a III-V p-i-n junction: Comparison of density functional and tight-binding approaches

Stokbro, Kurt ; Blom, Anders ; Smidstrup, Soren

2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2013, p.380-383

IEEE

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2
Identification of zirconia and hafnia crystalline phases by optical spectroscopy from first-principles
Identification of zirconia and hafnia crystalline phases by optical spectroscopy from first-principles
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Identification of zirconia and hafnia crystalline phases by optical spectroscopy from first-principles

Gunst, Tue ; Stradi, Daniele ; Blom, Anders Attias, André-Jean ; Park, Wounjhang ; Panchapakesan, Balaji

SPIE 2020

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3
First-principles method for the phonon-limited resistivity of metals
First-principles method for the phonon-limited resistivity of metals
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First-principles method for the phonon-limited resistivity of metals

Gunst, Tue ; Blom, Anders ; Stokbro, Kurt

2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2018, p.79-82

IEEE

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4
Ab initio LCAO hybrid density-functional method for accurate, large-scale electronic structure simulations of semiconductor materials, interfaces and gate stacks
Ab initio LCAO hybrid density-functional method for accurate, large-scale electronic structure simulations of semiconductor materials, interfaces and gate stacks
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Ab initio LCAO hybrid density-functional method for accurate, large-scale electronic structure simulations of semiconductor materials, interfaces and gate stacks

Khomyakov, Petr A. ; Wellendorff, Jess ; Palsgaard, Mattias ; Gunst, Tue ; Miyagi, Haruhide ; Verstichel, Brecht ; Corsetti, Fabiano ; Arcisauskaite, Vaida ; Martinez, Umberto ; Blom, Anders ; Smidstrup, Soren

2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2021, p.124-127

IEEE

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5
Atomistic Modeling Of Nanoscale Ferroelectric Capacitors Using a Density Functional Theory And Non-Equilibrium Green's-Function Method
Atomistic Modeling Of Nanoscale Ferroelectric Capacitors Using a Density Functional Theory And Non-Equilibrium Green's-Function Method
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Atomistic Modeling Of Nanoscale Ferroelectric Capacitors Using a Density Functional Theory And Non-Equilibrium Green's-Function Method

Stradi, Daniele ; Vej-Hansen, Ulrik G. ; Khomyakov, Petr A. ; Lee, Maeng-Eun ; Penazzi, Gabriele ; Blom, Anders ; Wellendorff, Jess ; Smidstrup, Soren ; Stokbro, Kurt

2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2019, p.1-4

IEEE

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6
First-principles simulations of nanoscale transistors
First-principles simulations of nanoscale transistors
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First-principles simulations of nanoscale transistors

Blom, Anders ; Martinez Pozzoni, Umberto ; Markussen, Troels ; Stokbro, Kurt

2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2015, p.52-55

IEEE

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7
Grain boundary scattering in Ru and Cu interconnects
Grain boundary scattering in Ru and Cu interconnects
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Grain boundary scattering in Ru and Cu interconnects

Markussen, Troels ; Aboud, Shela ; Blom, Anders ; Lanzillo, Nicholas A. ; Gunst, Tue ; Cobb, Jonathan ; Philip, Tim M. ; Robison, Robert R.

2020 IEEE International Interconnect Technology Conference (IITC), 2020, p.76-78

IEEE

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8
First-principles modeling of SiGe alloys and devices
First-principles modeling of SiGe alloys and devices
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First-principles modeling of SiGe alloys and devices

Blom, Anders ; Khomyakov, Petr ; Stradi, Daniele ; Stokbro, Kurt

2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO), 2017, p.339-340

IEEE

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9
Analysis of optimal energy management in smart homes using MPC
Analysis of optimal energy management in smart homes using MPC
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Analysis of optimal energy management in smart homes using MPC

Sundstrom, Christofer ; Jung, Daniel ; Blom, Anders

2016 EUROPEAN CONTROL CONFERENCE (ECC), 2016, p.2066-2071

IEEE

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10
Atomistic approach for modeling metal-semiconductor interfaces
Atomistic approach for modeling metal-semiconductor interfaces
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Atomistic approach for modeling metal-semiconductor interfaces

Stradi, Daniele ; Martinez, Umberto ; Blom, Anders ; Brandbyge, Mads ; Stokbro, Kurt

2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO), 2016, p.895-898

IEEE

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