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Refinado por: Base de dados/Biblioteca: IEEE Electronic Library (IEL) Journals remover tipo de recurso: magazinearticle remover
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Advances in Design and Test of Monolithic 3-D ICs
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Advances in Design and Test of Monolithic 3-D ICs

Chaudhuri, Arjun ; Banerjee, Sanmitra ; Park, Heechun ; Kim, Jinwoo ; Murali, Gauthaman ; Lee, Edward ; Kim, Daehyun ; Lim, Sung Kyu ; Mukhopadhyay, Saibal ; Chakrabarty, Krishnendu

IEEE design and test, 2020-08, Vol.37 (4), p.92-100

Piscataway: IEEE Computer Society

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Roundtable: Machine Learning for Embedded Systems: Hype or Lasting Impact?
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magazinearticle
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Roundtable: Machine Learning for Embedded Systems: Hype or Lasting Impact?

Hu, X. Sharon ; Ernst, Rolf ; Eles, Petru ; Heiser, Gernot ; Keutzer, Kurt ; Kim, Daehyun ; Tohdo, Tetsuya

IEEE design and test, 2018-12, Vol.35 (6), p.86-93

Piscataway: IEEE Computer Society

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Machine Learning for Embedded Systems: Hype or Lasting Impact? A Panel at ESWEEK 2017
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magazinearticle
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Machine Learning for Embedded Systems: Hype or Lasting Impact? A Panel at ESWEEK 2017

Hu, X. Sharon ; Ernst, Rolf ; Eles, Petru Ion ; Heiser, Gernot ; Keutzer, Kurt ; Kim, Daehyun ; Tohdo, Tetsuya

IEEE design and test, 2018-11, Vol.35 (6), p.86

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Image Processing on Multicore x86 Architectures
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magazinearticle
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Image Processing on Multicore x86 Architectures

Kim, Daehyun ; Lee, Victor W. ; Chen, Yen-Kuang

IEEE signal processing magazine, 2010-03, Vol.27 (2), p.97-107

New York: IEEE

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5
A Handy Dandy Doherty PA: A Linear Doherty Power Amplifier for Mobile Handset Application
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magazinearticle
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A Handy Dandy Doherty PA: A Linear Doherty Power Amplifier for Mobile Handset Application

Cho, Yunsung ; Kang, Daehyun ; Moon, Kyunghoon ; Jeong, Daechul ; Kim, Bumman

IEEE microwave magazine, 2017-09, Vol.18 (6), p.110-124

New York: IEEE

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