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Material Type: Artigo
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High Throughput/Gate AES Hardware Architectures Based on Datapath CompressionUeno, Rei ; Homma, Naofumi ; Morioka, Sumio ; Miura, Noriyuki ; Matsuda, Kohei ; Nagata, Makoto ; Bhasin, Shivam ; Mathieu, Yves ; Graba, Tarik ; Danger, Jean-LucIEEE transactions on computers, 2020-04, Vol.69 (4), p.534-548 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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Pipelined Parallel FFT Architectures via Folding TransformationAyinala, M. ; Brown, M. ; Parhi, K. K.IEEE transactions on very large scale integration (VLSI) systems, 2012-06, Vol.20 (6), p.1068-1081 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Parallel Architecture for Hierarchical Optical Flow Estimation Based on FPGABarranco, F. ; Tomasi, M. ; Diaz, J. ; Vanegas, M. ; Ros, E.IEEE transactions on very large scale integration (VLSI) systems, 2012-06, Vol.20 (6), p.1058-1067 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Energy-Efficient High-Throughput Montgomery Modular Multipliers for RSA CryptosystemsKUANG, Shiann-Rong ; WANG, Jiun-Ping ; CHANG, Kai-Cheng ; HSU, Huan-WeiIEEE transactions on very large scale integration (VLSI) systems, 2013-11, Vol.21 (11), p.1999-2009 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Overview of the architecture, circuit design, and physical implementation of a first-generation cell processorPham, D.C. ; Aipperspach, T. ; Boerstler, D. ; Bolliger, M. ; Chaudhry, R. ; Cox, D. ; Harvey, P. ; Harvey, P.M. ; Hofstee, H.P. ; Johns, C. ; Kahle, J. ; Kameyama, A. ; Keaty, J. ; Masubuchi, Y. ; Pham, M. ; Pille, J. ; Posluszny, S. ; Riley, M. ; Stasiak, D.L. ; Suzuoki, M. ; Takahashi, O. ; Warnock, J. ; Weitzel, S. ; Wendel, D. ; Yazawa, K.IEEE journal of solid-state circuits, 2006-01, Vol.41 (1), p.179-196 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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The CGEM-IT readout chainAmoroso, A. ; Baldini Ferroli, R. ; Balossino, I. ; Bertani, M. ; Bettoni, D. ; Bianchi, F. ; Bortone, A. ; Bugalho, R. ; Calcaterra, A. ; Cerioni, S. ; Chiozzi, S. ; Cibinetto, G. ; Cotta Ramusino, A. ; Cossio, F. ; Da Rocha Rolo, M. ; De Mori, F. ; Destefanis, M. ; Di Francesco, A. ; Evangelisti, F. ; Farinelli, R. ; Fava, L. ; Felici, G. ; Garbolino, S. ; Garzia, I. ; Gatta, M. ; Giraudo, G. ; Gramigna, S. ; Greco, M. ; Lavezzi, L. ; Maggiora, M. ; Malaguti, R. ; Mangoni, A. ; Marcello, S. ; Marciniewski, P. ; Melchiorri, M. ; Mezzadri, G. ; Mignone, M. ; Morgante, S. ; Pace, E. ; Pacetti, S. ; Patteri, P. ; Rivetti, A. ; Scodeggio, M. ; Sosio, S. ; Spataro, S. ; Varela, J. ; Wheadon, R.Journal of instrumentation, 2021-08, Vol.16 (8), p.P08065 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation TimeSalmani, H. ; Tehranipoor, M. ; Plusquellic, J.IEEE transactions on very large scale integration (VLSI) systems, 2012-01, Vol.20 (1), p.112-125 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Hardware Trojans: Lessons Learned after One Decade of ResearchXiao, K. ; Forte, D. ; Jin, Y. ; Karri, R. ; Bhunia, S. ; Tehranipoor, M.ACM transactions on design automation of electronic systems, 2016-12, Vol.22 (1), p.1-23 [Periódico revisado por pares]Texto completo disponível |
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Material Type: Artigo
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A Memory-Efficient and Highly Parallel Architecture for Variable Block Size Integer Motion Estimation in H.264/AVCKAO, Chao-Yang ; LIN, Youn-LongIEEE transactions on very large scale integration (VLSI) systems, 2010-06, Vol.18 (6), p.866-874 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Flexible Hardware Architecture of Hierarchical K-Means Clustering for Large Cluster NumberCHEN, Tse-Wei ; CHIEN, Shao-YiIEEE transactions on very large scale integration (VLSI) systems, 2011-08, Vol.19 (8), p.1336-1345 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |