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X-ray Intensity Measurements in 2.8 kJ Plasma Focus Device Operated with Argon Using a Five Channel Diode SpectrometerAl-Hawat, Sh ; Akel, M. ; Shaaban, S.Journal of fusion energy, 2015-02, Vol.34 (1), p.163-171 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |