skip to main content
Result Number Material Type Add to My Shelf Action Record Details and Options
1
X-ray Intensity Measurements in 2.8 kJ Plasma Focus Device Operated with Argon Using a Five Channel Diode Spectrometer
Material Type:
Artigo
Adicionar ao Meu Espaço

X-ray Intensity Measurements in 2.8 kJ Plasma Focus Device Operated with Argon Using a Five Channel Diode Spectrometer

Al-Hawat, Sh ; Akel, M. ; Shaaban, S.

Journal of fusion energy, 2015-02, Vol.34 (1), p.163-171 [Periódico revisado por pares]

Boston: Springer US

Texto completo disponível

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Buscando em bases de dados remotas. Favor aguardar.