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Material Type: Artigo
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Temperature measurement in AlGaN/GaN High-Electron-Mobility Transistors using micro-Raman scattering spectroscopyAubry, R. ; Dua, C. ; Jacquet, J.-C. ; Lemaire, F. ; Galtier, P. ; Dessertenne, B. ; Cordier, Y. ; DiForte-Poisson, M.-A. ; Delage, S. L.European physical journal. Applied physics, 2005-05, Vol.30 (2), p.77-82 [Periódico revisado por pares]Les Ulis: EDP SciencesTexto completo disponível |
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Material Type: Artigo
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Temperature measurement by micro-Raman scattering spectroscopy in the active zone of AlGaN/GaN high-electron-mobility transistorsAubry, R. ; Dua, C. ; Jacquet, J.-C. ; Lemaire, F. ; Galtier, P. ; Dessertenne, B. ; Cordier, Y. ; DiForte-Poisson, M. -A. ; Delage, S. L.EPJ. Applied physics (Print), 2004-07, Vol.27 (1-3), p.293-296 [Periódico revisado por pares]Les Ulis: EDP SciencesTexto completo disponível |