Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Phase coherence theory for data-mining and analysis: application studies in spectroscopyDoyle, G ; McMillan, N. D ; Murtagh, F ; O'Neill, M ; Riedel, S ; Perova, T. S ; Unnikrishnan, S ; Moore, R. AProc. SPIE, 2005, Vol.5823, p.70-81Bellingham, Wash: SPIETexto completo disponível |
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2 |
Material Type: Ata de Congresso
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Tensiograph drop volume method for characterization of alcohols and bifunctional liquidsMorrin, D ; McMillan, N. D ; Beverley, K ; O'Neill, M ; O'Rourke, B ; Dunne, G ; Riedel, S ; Augousti, A ; Mason, J ; Murtagh, F ; Kokuer, MProc. SPIE, 2005, Vol.5826, p.670-678Bellingham, Wash: SPIETexto completo disponível |
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3 |
Material Type: Ata de Congresso
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On-demand delivery of large compressed images in astronomy: computational requirementsMurtagh, Fionn D ; Louys, Mireille ; Starck, Jean-Luc ; Bonnarel, Francois ; Farid, Mohsen MSPIE 2001Texto completo disponível |
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4 |
Material Type: Ata de Congresso
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High-quality still images from video frame sequencesDaubos, Thierry ; Murtagh, Fionn DSPIE proceedings series, 2002, Vol.4709, p.49-59Bellingham WA: SPIETexto completo disponível |
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5 |
Material Type: Ata de Congresso
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Bayesian Segmentation and Clustering for Determining Cloud Mask ImagesBarreto, Dacil ; Murtagh, Fionn D ; Marcello, JavierSPIE proceedings series, 2003, Vol.4877, p.144-155Bellingham WA: SPIETexto completo disponível |
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6 |
Material Type: Ata de Congresso
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Bayesian Model Selection for Spatial Clustering in 3D SurveysMurtagh, Fionn D ; Donalek, C ; Longo, Giuseppe ; Tagliaferri, RobertoSPIE 2002Texto completo disponível |
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7 |
Material Type: Ata de Congresso
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Multiresolution Filtering and Segmentation of Multispectral ImagesMurtagh, Fionn D ; Collet, Christophe ; Louys, Mireille ; Starck, Jean-LucSPIE 2002Texto completo disponível |
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8 |
Material Type: Ata de Congresso
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Automated multiscale segmentation of volumetric biomedical imagery based on a Markov random field modelMontgomery, David W. G ; Amira, Abbes ; Murtagh, FionnProc. SPIE, 2005, Vol.5823, p.295-303Bellingham, Wash: SPIETexto completo disponível |
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9 |
Material Type: Ata de Congresso
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Interpolation artefact reduction by statistical approach in mutual information-based image registrationSu, Hongjiang ; Miller, Paul C ; Murtagh, FionnProc. SPIE, 2005, Vol.5823, p.200-208Bellingham, Wash: SPIETexto completo disponível |
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10 |
Material Type: Artigo
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Automatic visual inspection of woven textiles using a two-stage defect detectorCampbell, Jonathan G ; Murtagh, FionnOptical Engineering, 1998-09, Vol.37 (9), p.2536-2542 [Periódico revisado por pares]Texto completo disponível |