Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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The Undecimated Wavelet Decomposition and its ReconstructionStarck, J.-L. ; Fadili, J. ; Murtagh, F.IEEE transactions on image processing, 2007-02, Vol.16 (2), p.297-309 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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Gray and color image contrast enhancement by the curvelet transformStarck, J.-L. ; Murtagh, F. ; Candes, E.J. ; Donoho, D.L.IEEE transactions on image processing, 2003-06, Vol.12 (6), p.706-717 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Inpainting and Zooming Using Sparse RepresentationsFadili, M.J ; Starck, J.-L ; Murtagh, FComputer journal, 2009-01, Vol.52 (1), p.64-79 [Periódico revisado por pares]Oxford: Oxford University PressTexto completo disponível |
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4 |
Material Type: Artigo
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Automatic tumor segmentation using knowledge-based techniquesClark, M.C. ; Hall, L.O. ; Goldgof, D.B. ; Velthuizen, R. ; Murtagh, F.R. ; Silbiger, M.S.IEEE transactions on medical imaging, 1998-04, Vol.17 (2), p.187-201New York, NY: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Automatic segmentation of non-enhancing brain tumors in magnetic resonance imagesFletcher-Heath, Lynn M ; Hall, Lawrence O ; Goldgof, Dmitry B ; Murtagh, F.ReedArtificial intelligence in medicine, 2001-01, Vol.21 (1), p.43-63 [Periódico revisado por pares]Netherlands: Elsevier B.VTexto completo disponível |
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6 |
Material Type: Artigo
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A Study of the Neighborhood Counting SimilarityHui Wang ; Murtagh, F.IEEE transactions on knowledge and data engineering, 2008-04, Vol.20 (4), p.449-461 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Validity-guided (re)clustering with applications to image segmentationBensaid, A.M. ; Hall, L.O. ; Bezdek, J.C. ; Clarke, L.P. ; Silbiger, M.L. ; Arrington, J.A. ; Murtagh, R.F.IEEE transactions on fuzzy systems, 1996-05, Vol.4 (2), p.112-123 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Interpreting the Kohonen self-organizing feature map using contiguity-constrained clusteringMurtagh, F.Pattern recognition letters, 1995-04, Vol.16 (4), p.399-408 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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9 |
Material Type: Artigo
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Linear flaw detection in woven textiles using model-based clusteringCampbell, J.G ; Fraley, C ; Murtagh, F ; Raftery, A.EPattern recognition letters, 1997-12, Vol.18 (14), p.1539-1548 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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10 |
Material Type: Artigo
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Axiomatic approach to feature subset selection based on relevanceHui Wang ; Bell, D. ; Murtagh, F.IEEE transactions on pattern analysis and machine intelligence, 1999-03, Vol.21 (3), p.271-277 [Periódico revisado por pares]IEEETexto completo disponível |