Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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ISCAS 1993 IEEE International Symposium on Circuits and Systems Sheraton Chicago Hotel & Towers, Chicago, IL, May 3-6, 1993IEEE International Symposium on Circuits and Systems (26th 1993 Chicago, Ill.) Wai-Kai Chen; Institute of Electrical and Electronics EngineersNew York Institute of Electrical and Electronics Engineers c1993Localização: EPBC - Esc. Politécnica-Bib Central (621.38 Ie2p 1993 v.4 )(Acessar) |
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2 |
Material Type: Livro
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ISCAS 1994 IEEE International Symposium on Circuits and Systems The New Connaught Rooms, London, England, May 30-June 2, 1994IEEE International Symposium on Circuits and Systems (27th 1994 London, England) Robert Spence 1933-; Institute of Electrical and Electronics EngineersNew York Institute of Electrical and Electronics Engineers c1994Localização: EPBC - Esc. Politécnica-Bib Central (621.38 Ie2p 1994 v.6 )(Acessar) |
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3 |
Material Type: Livro
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ISCAS 1992 IEEE International Symposium on Circuits and Systems the Sheraton Hotel, San Diego, Calif., May 10-13, 1992IEEE International Symposium on Circuits and Systems (25th 1992 San Diego, Calif.) Stanley A White; Institute of Electrical and Electronics EngineersNew York Institute of Electrical and Electronics Engineers c1992Localização: EPBC - Esc. Politécnica-Bib Central (621.38 Ie2p 1992 v.6 )(Acessar) |
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4 |
Material Type: Livro
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ISCAS 1995 IEEE International Symposium on Circuits and Systems Seattle, Washington, USA, April 30 - May 3, 1995IEEE International Symposium on Circuits and Systems (1995 Seattle, Wash.) Institute of Electrical and Electronics Engineers; IEEE Circuits and Systems SocietyNew York, N.Y. Institute of Electrical and Electronics Engineers Piscataway, NJ IEEE Service Center c1995Localização: EPBC - Esc. Politécnica-Bib Central (621.38 Ie2p 1995 v.3 )(Acessar) |
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5 |
Material Type: Livro
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Periodic Structures: Mode-Matching Approach and Applications in Electromagnetic EngineeringHwang, Ruey-Bing (Raybeam)Newark: Wiley-IEEE Press 2012Texto completo disponível |