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Papers from the 21st International Vacuum Nanoelectronics Conference (IVNC) : 13-17 July 2008, Wroclaw, Poland

International Vacuum Nanoelectronics Conference (21st : 2008 : Wroclaw, Poland) J. A Dziuban (Jan A.); American Vacuum Society.; Raith GmbH Germany.; Politechnika Wroc±awska.; International Conference on Nanoscience and Technology

Journal of vacuum science & technology. B, Microelectronics and nanometer structures. 2nd ser., v. 27, no. 2 (Mar.Apr. 2009), p. 686-777 (DLC) 94657460 (OCoLC)23276603

New York : Published by AVS through the American Institute of Physics 2009

Localização: IF - Instituto de Física    (J.Vac.Sci.Technol.B 2nd ser. v )(Acessar)

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Papers from the 20th International Vacuum Nanoelectronics Conference : 8-12 July 2007, Chicago, Illinois

International Vacuum Nanoelectronics Conference (20th : 2007 : Chicago, Ill.) Heinz Busta; American Vacuum Society.; Institute of Electrical and Electronics Engineers.

Journal of vacuum science & technology. B, Microelectronics and nanometer structures V. 26, no. 2 (Mar./Apr. 2008), p. 688-900 (DLC) 94657460 (OCoLC)23276603

New York : Published by AVS through the American Institute of Physics 2008

Localização: IF - Instituto de Física    (J.Vac.Sci.Technol.B v.26(2)200 )(Acessar)

3
Vacuum Nanoelectronic Devices: Novel Electron Sources and Applications
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Vacuum Nanoelectronic Devices: Novel Electron Sources and Applications

Evtukh, Anatoliy ; Hartnagel, Hans ; Yilmazoglu, Oktay ; Mimura, Hidenori ; Pavlidis, Dimitris

Newark: Wiley 2015

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A Microionizer for Portable Mass Spectrometers Using Double-Gated Isolated Vertically Aligned Carbon Nanofiber Arrays
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A Microionizer for Portable Mass Spectrometers Using Double-Gated Isolated Vertically Aligned Carbon Nanofiber Arrays

Liang-Yu Chen ; Velasquez-Garcia, L F ; Xiazhi Wang ; Teo, K ; Akinwande, A I

IEEE transactions on electron devices, 2011-07, Vol.58 (7), p.2149-2158 [Periódico revisado por pares]

New York, NY: IEEE

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Vacuum electronics
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Vacuum electronics

Parker, R.K. ; Abrams, R.H. ; Danly, B.G. ; Levush, B.

IEEE transactions on microwave theory and techniques, 2002-03, Vol.50 (3), p.835-845 [Periódico revisado por pares]

New York: IEEE

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Characterization system based on image mapping for field emission devices
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Characterization system based on image mapping for field emission devices

Kopelvski, Maycon M. ; Galeazzo, Elisabete ; Peres, Henrique E.M. ; Ramirez-Fernandez, Francisco J. ; Silva, Débora A.C. ; Dantas, Michel O.S.

Measurement : journal of the International Measurement Confederation, 2016-11, Vol.93, p.208-214 [Periódico revisado por pares]

London: Elsevier Ltd

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7
Flip-Cathode Design for Carbon Nanotube-Based Vacuum Triodes
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Flip-Cathode Design for Carbon Nanotube-Based Vacuum Triodes

Brunetti, F. ; Riccitelli, R. ; Di Carlo, A. ; Fiori, A. ; Orlanducci, S. ; Sessa, V. ; Terranova, M.L. ; Lucci, M. ; Merlo, V. ; Cirillo, M.

IEEE electron device letters, 2008-01, Vol.29 (1), p.111-113 [Periódico revisado por pares]

New York, NY: IEEE

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Simulation of Electron Hop Funnel Hysteresis
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Simulation of Electron Hop Funnel Hysteresis

Pearlman, Marcus ; Rowe, Tyler ; Browning, Jim

IEEE transactions on plasma science, 2013-08, Vol.41 (8), p.2291-2298 [Periódico revisado por pares]

New York: IEEE

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Vacuum microelectronics
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Vacuum microelectronics

Zhu, Wei

Newark: WILEY 2004

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10
One of perspective directions of creation of highly effective field emission microdevices and microdisplays
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One of perspective directions of creation of highly effective field emission microdevices and microdisplays

Mukhurov, N.I. ; Zhdanok, S.A. ; Gasenkova, I.V. ; Plevako, F.V.

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737), 2004, p.132-133

Piscataway NJ: IEEE

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